論文誌
|
Y. Gomi, A. Sato, W. Madany, K. Okada, S. Adachi, M. Itoh, M.Hashimoto
|
A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement
|
IEEE Solid-State Circuits Letters
| 8
|
245-248
|
2025年9月
|
| pdf
|
論文誌
|
K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, M. Hashimoto
|
Analyzing DUE Errors on GPUs with Neutron Irradiation Test and Fault Injection to Control Flow
|
IEEE Transactions on Nuclear Science
| 68(8)
|
1668--1674
|
2021年8月
|
| pdf
|
論文誌
|
Y. Masuda, T. Onoye, M. Hashimoto
|
Performance Evaluation of Software-Based Error Detection Mechanisms for Supply Noise Induced Timing Errors
|
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
| E100-A(7)
|
1452--1463
|
2017年7月
|
| pdf
|
論文誌
|
H. Fuketa, R. Harada, M. Hashimoto, T. Onoye
|
Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM
|
IEEE Transactions on Device and Materials Reliability
| 14(1)
|
463 -- 470
|
2014年3月
|
| 185.pdf
|
論文誌
|
H. Fuketa, M. Hashimoto, Y. Mitsuyama, T. Onoye
|
Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
|
IEEE Transactions on Nuclear Science
| 58(4)
|
2097--2102
|
2011年8月
|
| 159.pdf
|
論文誌
|
T. Kanamoto, S. Akutsu, T. Nakabayashi, T. Ichinomiya, K. Hachiya, A. Kurokawa, H. Ishikawa, S. Muromoto, H. Kobayashi, M. Hashimoto
|
Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation
|
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
| E89-A(12)
|
3666-3670
|
2006年12月
|
| 5.pdf
|
国際会議
|
M. Hashimoto
|
Characterization and Understanding of Cosmic Ray-Induced Soft Errors in SRAMs
|
Proceedings of International Meeting for Future of Electron Devices, Kansai
|
|
|
2024年11月
|
| pdf
|
国際会議
|
Masanori Hashimoto
|
Characterization and Understanding of Cosmic Ray-Induced Soft Errors in Srams
|
Proceedings of International Meeting for Future of Electron Devices, Kansai (IMFEDK)
|
|
|
2024年11月
|
| pdf
|
国際会議
|
M. Yoshida, R. Iwamoto, M. Itoh, M. Hashimoto
|
Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2023年9月
|
| pdf
|
国際会議
|
M. Kamibayashi, K. Kobayashi, M. Hashimoto
|
Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective-
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2022年10月
|
|
|
国際会議
|
K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, M. Hashimoto
|
Analyzing DUE Errors with Neutron Irradiation Test and Fault Injection to Control Flow
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2020年10月
|
|
|
国際会議
|
H. Fuketa, M. Hashimoto, Y. Mitsuyama, T. Onoye
|
Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
213--217
|
2010年5月
|
| 140.PDF
|
著書
|
E. Ibe, S. Yoshimoto, M. Yoshimoto, H. Kawaguchi, K. Kobayashi, J. Furuta, Y. Mitsuyama, M. Hashimoto, T. Onoye, H. Kanbara, H. Ochi, K. Wakabayashi, H. Onodera, M. Sugihara
|
Radiation-Induced Soft Errors
|
Book chapter, VLSI Design and Test for Systems Dependability, Springer
|
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2018年8月
|
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