論文誌
|
Y. Deng, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, Y. Miyake
|
Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 71(4)
|
912-920
|
2024年4月
|
| pdf
|
論文誌
|
W. Liao, K. Ito, S. Abe, Y. Mitsuyama, M. Hashimoto
|
Characterizing Energetic Dependence of Low-energy Neutron-induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65 nm Bulk SRAM
|
IEEE Transactions on Nuclear Science
| 68(6)
|
1228-1234
|
2021年6月
|
| pdf
|
論文誌
|
T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, A. Sato
|
Irradiation Test of 65 nm Bulk SRAMs with DC Muon Beam at RCNP MuSIC Facility
|
IEEE Transactions on Nuclear Science
| 67(7)
|
1555 -- 1559
|
2020年7月
|
| pdf
|
論文誌
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, Y. Miyake
|
Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs
|
IEEE Transactions on Nuclear Science
| 67(7)
|
1566 -- 1572
|
2020年7月
|
| pdf
|
論文誌
|
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, Y. Watanabe
|
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1374 -- 1380
|
2019年7月
|
| pdf
|
論文誌
|
W. Liao, M. Hashimoto, S. Manabe, S. Abe, Y. Watanabe
|
Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1390 -- 1397
|
2019年7月
|
| pdf
|
論文誌
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, S. Abe
|
Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1398 -- 1403
|
2019年7月
|
| pdf
|
論文誌
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 65(8)
|
1734--1741
|
2018年8月
|
| pdf
|
論文誌
|
S. Hirokawa, R. Harada, M. Hashimoto, T. Onoye
|
Characterizing Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4-V SRAMs
|
IEEE Transactions on Nuclear Science
| 62(2)
|
420--427
|
2015年4月
|
| 219.pdf
|
国際会議
|
K. Takeuchi, T. Kato, M. Hashimoto
|
An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs
|
Proceedings of International Symposium on Reliability Physics (IRPS)
|
|
|
2024年4月
|
| pdf
|
国際会議
|
W. Liao, K. Ito, Y. Mitsuyama, M. Hashimoto
|
Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
|
2020年4月
|
| pdf
|
国際会議
|
T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, A. Sato
|
Irradiation Test of 65-nm Bulk SRAMs with DC Muon Beam at RCNP-MuSIC Facility
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2019年9月
|
|
|
国際会議
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, Y. Miyake
|
Impact of Incident Angle on Negative Muon-Induced SEU Cross Section of 65-nm Bulk SRAM
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2019年9月
|
|
|
国際会議
|
J. Kuroda, S. Manabe, Y. Watanabe, K. Ito, W. Liao, M. Hashimoto, S. Abe, M. Harada, K. Oikawa, Y. Miyake
|
Measurement of Single-Event Upsets in 65-nm Bulk SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2019年9月
|
|
|
国際会議
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, Y. Miyake
|
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
|
2019年4月
|
| pdf
|
国際会議
|
M. Hashimoto, W. Liao, S. Manabe, Y. Watanabe
|
Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited)
|
Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
|
|
|
2018年10月
|
| pdf
|
国際会議
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, S. Abe
|
Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2018年9月
|
|
|
国際会議
|
W. Liao, M. Hashimoto, S. Manabe, S. Abe, Y. Watanabe
|
Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2018年9月
|
|
|
国際会議
|
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, Y. Watanabe
|
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2018年9月
|
|
|
国際会議
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2017年10月
|
|
|
国際会議
|
W. Liao, S. Hirokawa, R. Harada, M. Hashimoto
|
Contributions of SRAM, FF and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate -- Bulk vs. FD-SOI at 0.5 and 1.0V --
|
Proceedings of International NEWCAS Conference
|
|
33-37
|
2017年6月
|
| pdf
|
国際会議
|
S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, Y. Watanabe
|
Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
2015年7月
|
|
|
国際会議
|
T. Uemura, S. Okano, T. Kato, H. Matsuyama, M. Hashimoto
|
Soft Error Immune Latch Design for 20 nm Bulk CMOS
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
|
2015年4月
|
| 217.pdf
|
国際会議
|
R. Harada, S. Hirokawa, M. Hashimoto
|
Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
2014年7月
|
|
|
国際会議
|
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
|
Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
2013年7月
|
|
|
