Detail of a work
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| S. Kimura, M. Hashimoto, and T. Onoye, "Body Bias Clustering for Low Test-Cost Post-Silicon Tuning," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pp. 283--289, February 2012. | |
| ID | 311 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Body Bias Clustering for Low Test-Cost Post-Silicon Tuning |
| 表題 (英文) |
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| 著者名 (author) |
S. Kimura,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
283--289 |
| 刊行月 (month) |
2 |
| 出版年 (year) |
2012 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 167.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id311,
title = {Body Bias Clustering for Low Test-Cost Post-Silicon Tuning },
author = {S. Kimura and M. Hashimoto and T. Onoye},
journal = {Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)},
pages = {283--289},
month = {2},
year = {2012},
}
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