この検索内の頻出タグ: seu^:16 srams^:13 bulk^:10 muon-induced^:8 cross^:6 65-nm^:5 28-nm^:4 finfet^:4 impact^:4 mcu^:4 neutron-induced^:4 planar^:4 sections^:4 12-nm^:3 analysis^:3 characterizing^:3 negative^:3 sotb^:3 alpha-^:2 angle^:2 cell^:2 dependence^:2 different^:2 estimation^:2 rates^:2 section^:2 simulation^:2 sram^:2 types^:2 utbb-soi^:2

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@article{id655,
         title = {Muon-Induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs}, and {28-nm} Planar {SRAMs} and Register Files},
        author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and R. Yasuda and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
         month = {0},
          year = {(to appear)},
}

@article{id582,
         title = {Impact of Neutron-induced {SEU} in {FPGA} {CRAM} on Image-based Lane Tracking for Autonomous Driving: from Bit Upset to {SEFI} and Erroneous Behavior},
        author = {T. Tanaka and W. Liao and M. Hashimoto and Y. Mitsuyama},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {69},
        number = {1},
         pages = {35--42},
         month = {1},
          year = {2022},
}

@article{id571,
         title = {Characterizing Energetic Dependence of {Low-energy} {Neutron-induced} {SEU} and {MCU} and Its Influence on Estimation of Terrestrial {SER} in 65 {nm} Bulk {SRAM}},
        author = {W. Liao and K. Ito and S. Abe and Y. Mitsuyama and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {68},
        number = {6},
         pages = {1228-1234},
         month = {6},
          year = {2021},
}

@article{id540,
         title = {Impact of the Angle of Incidence on Negative Muon-induced {SEU} Cross Sections of {65-nm} Bulk and {FDSOI} {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1566 -- 1572},
         month = {7},
          year = {2020},
}

@article{id511,
         title = {Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and S. Abe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1398 -- 1403},
         month = {7},
          year = {2019},
}

@article{id404,
         title = {Characterizing alpha- and neutron-induced {SEU} and {MCU} on {SOTB} and bulk {0.4-V} {SRAMs}},
        author = {S. Hirokawa and R. Harada and M. Hashimoto and T. Onoye},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {62},
        number = {2},
         pages = {420--427},
         month = {4},
          year = {2015},
}

@article{id652,
         title = {{HachiFI:} A Lightweight {SoC} Architecture-Independent Fault-Injection Framework for {SEU} Impact Evaluation},
        author = {Q. Cheng and W. Liao and R. Zhang and H. Yu and L. Lin and M. Hashimoto},
       journal = {Proceedings of Design, Automation and Test in Europe Conference (DATE)},
         month = {3},
          year = {2025},
}

@article{id637,
         title = {Muon-induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs}},
        author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and R. Yasuda and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2024},
}

@article{id627,
         title = {An {SEU} Cross Section Model Reproducing {LET} and Voltage Dependence in Bulk Planar and {FinFET} {SRAMs}},
        author = {K. Takeuchi and T. Kato and M. Hashimoto},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2024},
}

@article{id618,
         title = {Muon-Induced {SEU} Cross Sections of {12-nm} {FinFET} and {28-nm} Planar {SRAMs}},
        author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and I. Umegaki and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2023},
}

@article{id606,
         title = {Characterizing {SEU} Cross Sections of 12- and {28-nm} {SRAMs} for 6.0, 8.0, and 14.8 {MeV} Neutrons},
        author = {K. Takami and Y. Gomi and S. Abe and W. Liao and S. Manabe and T. Matsumoto and M. Hashimoto},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {3},
          year = {2023},
}

@article{id520,
         title = {Impact of Incident Angle on Negative Muon-induced {SEU} Cross Section of {65-nm} Bulk {SRAM}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id500,
         title = {Negative and Positive Muon-induced {SEU} Cross Sections in {28-nm} and {65-nm} Planar Bulk {CMOS} {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {4},
          year = {2019},
}

@article{id482,
         title = {Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and S. Abe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}

@article{id413,
         title = {Neutron-Induced {SEU} and {MCU} Rate Characterization and Analysis of {SOTB} and Bulk {SRAMs} at {0.3V} Operation},
        author = {S. Hirokawa and R. Harada and M. Hashimoto and K. Sakuta and Y. Watanabe},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2015},
}

@article{id379,
         title = {Measurement of Alpha- and Neutron-Induced {SEU} and {MCU} on {SOTB} and Bulk 0.4 V {SRAMs}},
        author = {R. Harada and S. Hirokawa and M. Hashimoto},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2014},
}