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\title{\LARGE\bf 研究業績リスト}

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\fancyhead[CE,CO]{\bf 研究業績リスト}
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\section{論文誌}
\label{sec:0}

\renewcommand{\labelenumi}{[\ref{sec:0}.\arabic{enumi}]}
\begin{enumerate}
\item
Y. Deng, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, and Y. Miyake, ``Impact of Irradiation Side on Muon-Induced Single Event Upsets in {65-nm} Bulk {SRAMs},'' IEEE Transactions on Nuclear Science, volume 71, number 4, pages 912-920, April 2024.
\item
T. Tanaka, W. Liao, M. Hashimoto, and Y. Mitsuyama, ``Impact of Neutron-Induced {SEU} in {FPGA} {CRAM} on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to {SEFI} and Erroneous Behavior,'' IEEE Transactions on Nuclear Science, volume 69, number 1, pages 35--42, January 2022.
\item
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, and Y. Miyake, ``Impact of the Angle of Incidence on Negative Muon-Induced {SEU} Cross Sections of {65-nm} Bulk and {FDSOI} {SRAMs},'' IEEE Transactions on Nuclear Science, volume 67, number 7, 1566 -- 1572, July 2020.
\item
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, and Y.  Watanabe, ``Impact of Irradiation Side on Neutron-Induced Single Event Upsets in {65-nm} Bulk {SRAMs},'' IEEE Transactions on Nuclear Science, volume 66, number 7, 1374 -- 1380, July 2019.
\item
T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Soft-Error in {SRAM} at Ultra-Low Voltage  and Impact of Secondary Proton  in Terrestrial Environment,'' IEEE Transactions on Nuclear Science, volume 60, number 6, pages 4232--4237, December 2013.
\item
R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Impact of {NBTI-Induced} Pulse-Width Modulation on {SET} Pulse-Width Measurement,'' IEEE Transactions on Nuclear Science, volume 60, number 4, pages 2630--2634, August 2013.
\item
T. Kanamoto, S. Akutsu, T. Nakabayashi, T. Ichinomiya, K. Hachiya, A. Kurokawa, H. Ishikawa, S. Muromoto, H. Kobayashi, and M. Hashimoto, ``Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3666-3670, December 2006.
\end{enumerate}
\section{国際会議}
\label{sec:1}

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\item
Q. Cheng, W. Liao, R. Zhang, H. Yu, L. Lin, and M. Hashimoto, ``{HachiFI:} a Lightweight {SoC} Architecture-Independent Fault-Injection Framework for {SEU} Impact Evaluation,'' Proceedings of Design, Automation and Test in Europe Conference (DATE),   March 2025.
\item
Q. Cheng, Q. Li, L. Lin, W. Liao, L. Dai, H. Yu, and M. Hashimoto, ``How Accurately Can Soft Error Impact Be Estimated in Black-Box/White-Box Cases? -- a Case Study with an Edge {AI} {SoC} --,'' Proceedings of Design Automation Conference (DAC),   June 2024.
\item
S. Abe, T. Sato, J. Kuroda, S. Manabe, Y. Watanabe, W. Liao, K. Ito, M. Hashimoto, M. Harada, K. Oikawa, and Y. Miyake, ``Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets,'' Proceedings of International Symposium on Reliability Physics (IRPS),   April 2020.
\item
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, and Y. Miyake, ``Impact of Incident Angle on Negative Muon-Induced {SEU} Cross Section of {65-nm} Bulk {SRAM},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2019.
\item
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, and Y. Watanabe, ``Impact of Irradiation Side on Neutron-Induced Single Event Upsets in {65-nm} Bulk {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2018.
\item
T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, ``Impact of Package on Neutron Induced Single Event Upset in 20 {nm} {SRAM},'' Proceedings of International Symposium on Reliability Physics (IRPS),   April 2015.
\item
T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, ``Soft-Error in {SRAM} at Ultra Low Voltage and Impact of Secondary Proton in Terrestrial Environment,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC),   July 2013.
\item
R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, ``Impact of {NBTI-Induced} Pulse-Width Modulation on {SET} Pulse-Width Measurement,'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2012.
\end{enumerate}
以上．
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