: S. Abe, T. Sato, J. Kuroda, S. Manabe, Y. Watanabe, W. Liao, K. Ito, M. Hashimoto, M. Harada, K. Oikawa, and Y. Miyake, Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets, April 2020.
Detail of a work
| Tweet | |
| S. Abe, T. Sato, J. Kuroda, S. Manabe, Y. Watanabe, W. Liao, K. Ito, M. Hashimoto, M. Harada, K. Oikawa, and Y. Miyake, "Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets," Proceedings of International Symposium on Reliability Physics (IRPS), April 2020. | |
| ID | 538 |
| 分類 | 国際会議 |
| タグ | event hydrided impact materials near neutron-induced non-hydrided single transisotrs upsets |
| 表題 (title) |
Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets |
| 表題 (英文) |
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| 著者名 (author) |
S. Abe,T. Sato,J. Kuroda,S. Manabe,Y. Watanabe,W. Liao,K. Ito,M. Hashimoto,M. Harada,K. Oikawa,Y. Miyake |
| 英文著者名 (author) |
S. Abe,T. Sato,,S. Manabe,Y. Watanabe,W. Liao,,M. Hashimoto,,,Y. Miyake |
| キー (key) |
S. Abe,T. Sato,,S. Manabe,Y. Watanabe,W. Liao,,M. Hashimoto,,,Y. Miyake |
| 定期刊行物名 (journal) |
Proceedings of International Symposium on Reliability Physics (IRPS) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
4 |
| 出版年 (year) |
2020 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id538,
title = {Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets},
author = {S. Abe and T. Sato and J. Kuroda and S. Manabe and Y. Watanabe and W. Liao and K. Ito and M. Hashimoto and M. Harada and K. Oikawa and Y. Miyake},
journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
month = {4},
year = {2020},
}
|