Academic Journal
|
, , , T. Kato, , , , , M. Hashimoto
|
Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset
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IEEE Transactions on Nuclear Science
| 72(8)
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2735 - 2742
|
August 2025
|
| pdf
|
Academic Journal
|
, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, Y. Miyake
|
Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 71(4)
|
912-920
|
April 2024
|
| pdf
|
Academic Journal
|
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto
|
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1374 -- 1380
|
July 2019
|
| pdf
|
Academic Journal
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, Y. Miyake
|
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs
|
IEEE Transactions on Nuclear Science
| 65(8)
|
1742--1749
|
August 2018
|
| pdf
|
International Conference
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Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
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September 2024
|
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International Conference
|
S. Abe, T. Sato, , S. Manabe, Y. Watanabe, W. Liao, , M. Hashimoto, , , Y. Miyake
|
Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets
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Proceedings of International Symposium on Reliability Physics (IRPS)
|
|
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April 2020
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| pdf
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International Conference
|
, , W. Liao, M. Hashimoto
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When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies
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Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)
|
|
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January 2020
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| pdf
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International Conference
|
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, Y. Watanabe
|
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
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September 2018
|
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International Conference
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T. Uemura, T. Kato, S. Okano, H. Matsuyama, M. Hashimoto
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Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM
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Proceedings of International Symposium on Reliability Physics (IRPS)
|
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April 2015
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| 215.pdf
|
International Conference
|
T. Uemura, M. Hashimoto
|
Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag
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Proceedings of International Symposium on Reliability Physics (IRPS)
|
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April 2015
|
| 216.pdf
|
