List of works
この検索内の頻出タグ: event:8 single:8 impact:5 upsets:5 65-nm:4 srams:4 bulk:3 irradiation:3 neutron-induced:3 side:3 upset:3 muon-induced:2 20:1 deep:1 dose:1 electronic:1 explorations:1 feram:1 hydrided:1 induced:1 investigation:1 ionizing:1 materials:1 medical:1 meets:1 near:1 negative:1 networks:1 neural:1 neutron:1
- 論文誌
- [1] Y. Deng, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, and Y. Miyake, "Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs," IEEE Transactions on Nuclear Science, volume 71, number 4, pages 912-920, April 2024. [pdf]
- [2] S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, and Y. Watanabe, "Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs," IEEE Transactions on Nuclear Science, volume 66, number 7, 1374 -- 1380, July 2019. [pdf]
- [3] S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, and Y. Miyake, "Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs," IEEE Transactions on Nuclear Science, volume 65, number 8, pages 1742--1749, August 2018. [pdf]
- 国際会議
- [1] S. Abe, T. Sato, J. Kuroda, S. Manabe, Y. Watanabe, W. Liao, K. Ito, M. Hashimoto, M. Harada, K. Oikawa, and Y. Miyake, "Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets," Proceedings of International Symposium on Reliability Physics (IRPS), April 2020. [pdf]
- [2] Z. Yan, Y. Shi, W. Liao, M. Hashimoto, X. Zhou, and C. Zhuo, "When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), January 2020. [pdf]
- [3] S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, and Y. Watanabe, "Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2018.
- [4] T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, "Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. [215.pdf]
- [5] T. Uemura and M. Hashimoto, "Investigation of Single Event Upset and Total Ionizing Dose in FeRAM for Medical Electronic Tag," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. [216.pdf]