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\title{\LARGE\bf 研究業績リスト}

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\fancyhead[CE,CO]{\bf 研究業績リスト}
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\section{論文誌}
\label{sec:0}

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\begin{enumerate}
\item
T. Tanaka, W. Liao, M. Hashimoto, and Y. Mitsuyama, ``Impact of Neutron-Induced {SEU} in {FPGA} {CRAM} on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to {SEFI} and Erroneous Behavior,'' IEEE Transactions on Nuclear Science, volume 69, number 1, pages 35--42, January 2022.
\item
T. Kato, M. Hashimoto, and H. Matsuyama, ``Angular Sensitivity of Neutron-Induced Single-Event Upsets in {12-nm} {FinFET} {SRAMs} with Comparison to {20-nm} Planar {SRAMs},'' IEEE Transactions on Nuclear Science, volume 67, number 7, 1485 -- 1493, July 2020.
\item
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, and Y.  Watanabe, ``Impact of Irradiation Side on Neutron-Induced Single Event Upsets in {65-nm} Bulk {SRAMs},'' IEEE Transactions on Nuclear Science, volume 66, number 7, 1374 -- 1380, July 2019.
\item
W. Liao and M. Hashimoto, ``Analyzing Impacts of {SRAM}, {FF} and Combinational Circuit on Chip-Level Neutron-Induced Soft Error Rate,'' IEICE Trans. on Electronics, volume E102-C, number 4, pages 296--302, April 2019.
\item
S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, ``Characterizing Alpha- and Neutron-Induced {SEU} and {MCU} on {SOTB} and Bulk {0.4-V} {SRAMs},'' IEEE Transactions on Nuclear Science, volume 62, number 2, pages 420--427, April 2015.
\item
H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, ``Neutron-Induced Soft Errors and Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM},'' IEEE Transactions on Nuclear Science, volume 58, number 4, pages 2097--2102, August 2011.
\end{enumerate}
\section{国際会議}
\label{sec:1}

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\item
Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, ``Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in {22-nm} and {55-nm} {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),    採録済.
\item
M. Hashimoto, Y. Zhang, and K. Ito, ``Neutron-Induced Stuck Error Bits and Their Recovery in {DRAMs} on {GPU} Cards,'' Proceedings of International Conference on Solid State Devices and Materials (SSDM),   September 2022.
\item
S. Abe, T. Sato, J. Kuroda, S. Manabe, Y. Watanabe, W. Liao, K. Ito, M. Hashimoto, M. Harada, K. Oikawa, and Y. Miyake, ``Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets,'' Proceedings of International Symposium on Reliability Physics (IRPS),   April 2020.
\item
W. Liao, K. Ito, Y. Mitsuyama, and M. Hashimoto, ``Characterizing Energetic Dependence of Low-Energy Neutron-Induced {MCUs} in 65 {nm} Bulk {SRAMs},'' Proceedings of International Reliability Physics Symposium (IRPS),   April 2020.
\item
K. Ito, W. Liao, M. Hashimoto, J. Kuroda, S. Manabe, Y. Watanabe, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, ``Characterizing Neutron-Induced {SDC} Rate of Matrix Multiplication in Tesla P4 {GPU},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2019.
\item
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, and Y. Watanabe, ``Impact of Irradiation Side on Neutron-Induced Single Event Upsets in {65-nm} Bulk {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2018.
\item
W. Liao, S. Hirokawa, R. Harada, and M. Hashimoto, ``Contributions of {SRAM}, {FF} and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate  -- Bulk {vs.} {FD-SOI} at 0.5 and {1.0V} --,'' Proceedings of International NEWCAS Conference,  pages 33-37, June 2017.
\item
S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, ``Neutron-Induced {SEU} and {MCU} Rate Characterization and Analysis of {SOTB} and Bulk {SRAMs} at {0.3V} Operation,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC),   July 2015.
\item
R. Harada, S. Hirokawa, and M. Hashimoto, ``Measurement of Alpha- and Neutron-Induced {SEU} and {MCU} on {SOTB} and Bulk 0.4 V {SRAMs},'' IEEE Nuclear and Space Radiation Effects Conference (NSREC),   July 2014.
\end{enumerate}
以上．
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