この検索内の頻出タグ: neutron-induced^:16 srams^:9 bulk^:7 upsets^:7 impact^:4 rate^:4 seu^:4 65-nm^:3 characterizing^:3 error^:3 event^:3 mcu^:3 measurement^:3 single^:3 soft^:3 sotb^:3 sram^:3 22-nm^:2 55-nm^:2 alpha-^:2 chip-level^:2 circuit^:2 combinational^:2 event-wise^:2 ff^:2 gpu^:2 irradiation^:2 multiple-cell^:2 quasi^:2 side^:2

16 件の該当がありました． : このページのURL : HTML

@article{id690,
         title = {Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in {22-nm} and {55-nm} {SRAMs}},
        author = {Yuibi Gomi and Kazusa Takami and Ryuichi Yasuda and Hiroki Kanda and Mitsuhiro Fukuda and Masanori Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
         month = {0},
          year = {(to appear)},
}

@article{id582,
         title = {Impact of Neutron-induced {SEU} in {FPGA} {CRAM} on Image-based Lane Tracking for Autonomous Driving: from Bit Upset to {SEFI} and Erroneous Behavior},
        author = {T. Tanaka and W. Liao and M. Hashimoto and Y. Mitsuyama},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {69},
        number = {1},
         pages = {35--42},
         month = {1},
          year = {2022},
}

@article{id547,
         title = {Angular Sensitivity of Neutron-Induced Single-Event Upsets in {12-nm} {FinFET} {SRAMs} with Comparison to {20-nm} Planar {SRAMs}},
        author = {T. Kato and M. Hashimoto and H. Matsuyama},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1485 -- 1493},
         month = {7},
          year = {2020},
}

@article{id506,
         title = {Impact of Irradiation Side on Neutron-induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {S. Abe and W. Liao and S. Manabe and T. Sato and M. Hashimoto and Y.  Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1374 -- 1380},
         month = {7},
          year = {2019},
}

@article{id501,
         title = {Analyzing Impacts of {SRAM}, {FF} and Combinational Circuit on Chip-Level Neutron-Induced Soft Error Rate},
        author = {W. Liao and M. Hashimoto},
       journal = {IEICE Trans. on Electronics},
        volume = {E102-C},
        number = {4},
         pages = {296--302},
         month = {4},
          year = {2019},
}

@article{id404,
         title = {Characterizing alpha- and neutron-induced {SEU} and {MCU} on {SOTB} and bulk {0.4-V} {SRAMs}},
        author = {S. Hirokawa and R. Harada and M. Hashimoto and T. Onoye},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {62},
        number = {2},
         pages = {420--427},
         month = {4},
          year = {2015},
}

@article{id302,
         title = {Neutron-Induced Soft Errors and Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}},
        author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {58},
        number = {4},
         pages = {2097--2102},
         month = {8},
          year = {2011},
}

@article{id666,
         title = {Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in {22-nm} and {55-nm} {SRAMs}},
        author = {Y. Gomi and K. Takami and R. Yasuda and H. Kanda and M. Fukuda and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2025},
}

@article{id600,
         title = {Neutron-induced stuck error bits and their recovery in {DRAMs} on {GPU} cards},
        author = {M. Hashimoto and Y. Zhang and K. Ito},
       journal = {Proceedings of International Conference on Solid State Devices and Materials (SSDM)},
         month = {9},
          year = {2022},
}

@article{id538,
         title = {Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets},
        author = {S. Abe and T. Sato and J. Kuroda and S. Manabe and Y. Watanabe and W. Liao and K. Ito and M. Hashimoto and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2020},
}

@article{id539,
         title = {Characterizing Energetic Dependence of Low-Energy Neutron-induced {MCUs} in 65 {nm} Bulk {SRAMs}},
        author = {W. Liao and K. Ito and Y. Mitsuyama and M. Hashimoto},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {4},
          year = {2020},
}

@article{id519,
         title = {Characterizing Neutron-Induced {SDC} Rate of Matrix Multiplication in Tesla P4 {GPU}},
        author = {K. Ito and W. Liao and M. Hashimoto and J. Kuroda and S. Manabe and Y. Watanabe and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id484,
         title = {Impact of Irradiation Side on Neutron-induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {S. Abe and W. Liao and S. Manabe and T. Sato and M. Hashimoto and Y. Watanabe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}

@article{id452,
         title = {Contributions of {SRAM}, {FF} and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate  -- Bulk {vs.} {FD-SOI} at 0.5 and {1.0V} --},
        author = {W. Liao and S. Hirokawa and R. Harada and M. Hashimoto},
       journal = {Proceedings of International NEWCAS Conference},
         pages = {33-37},
         month = {6},
          year = {2017},
}

@article{id413,
         title = {Neutron-Induced {SEU} and {MCU} Rate Characterization and Analysis of {SOTB} and Bulk {SRAMs} at {0.3V} Operation},
        author = {S. Hirokawa and R. Harada and M. Hashimoto and K. Sakuta and Y. Watanabe},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2015},
}

@article{id379,
         title = {Measurement of Alpha- and Neutron-Induced {SEU} and {MCU} on {SOTB} and Bulk 0.4 V {SRAMs}},
        author = {R. Harada and S. Hirokawa and M. Hashimoto},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2014},
}