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論文誌

[1] J. Kuroda, S. Manabe, Y. Watanabe, K. Ito, W. Liao, M. Hashimoto, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, "Measurement of Single-Event Upsets in 65-nm SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF," IEEE Transactions on Nuclear Science, volume 67, number 7, 1599 -- 1605, July 2020. [pdf]

[2] S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, "Characterizing Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4-V SRAMs," IEEE Transactions on Nuclear Science, volume 62, number 2, pages 420--427, April 2015. [219.pdf]

[3] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1461--1467, July 2014. [200.pdf]

[4] H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM," IEEE Transactions on Device and Materials Reliability, volume 14, number 1, 463 -- 470, March 2014. [185.pdf]

[5] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement," IEEE Transactions on Nuclear Science, volume 60, number 4, pages 2630--2634, August 2013. [180.pdf]

[6] R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, "Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," IEEE Transactions on Nuclear Science, volume 59, number 6, pages 2791--2795, December 2012. [175.pdf]

[7] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 12, pages 2417--2423, December 2010. [149.pdf]

国際会議

[1] S. Abe, T. Sato, J. Kuroda, S. Manabe, Y. Watanabe, W. Liao, K. Ito, M. Hashimoto, M. Harada, K. Oikawa, and Y. Miyake, "Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets," Proceedings of International Symposium on Reliability Physics (IRPS), April 2020. [pdf]

[2] K. Ito, W. Liao, M. Hashimoto, J. Kuroda, S. Manabe, Y. Watanabe, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, "Characterizing Neutron-Induced SDC Rate of Matrix Multiplication in Tesla P4 GPU," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2019.

[3] J. Kuroda, S. Manabe, Y. Watanabe, K. Ito, W. Liao, M. Hashimoto, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, "Measurement of Single-Event Upsets in 65-nm Bulk SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2019.

[4] W. Liao, S. Hirokawa, R. Harada, and M. Hashimoto, "Contributions of SRAM, FF and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate -- Bulk vs. FD-SOI at 0.5 and 1.0V --," Proceedings of International NEWCAS Conference, pages 33-37, June 2017. [pdf]

[5] S. Hirokawa, R. Harada, K. Sakuta, Y. Watanabe, and M. Hashimoto, "Multiple Sensitive Volume Based Soft Error Rate Estimation with Machine Learning," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2016. [pdf]

[6] S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.

[7] R. Harada, S. Hirokawa, and M. Hashimoto, "Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.

[8] R. Harada, M. Hashimoto, and T. Onoye, "NBTI Characterization Using Pulse-Width Modulation," IEEE/ACM Workshop on Variability Modeling and Characterization, November 2013.

[9] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Impact of NBTI-­Induced Pulse-Width Modulation on SET Pulse-Width Measurement," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2012.

[10] R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, "Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2012.

[11] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects," Proceedings of International Reliability Physics Symposium (IRPS), April 2012. [168.PDF]

[12] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Neutron Induced Single Event Multiple Transients with Voltage Scaling and Body Biasing," Proceedings of International Reliability Physics Symposium (IRPS), pages 253--257, April 2011. [156.PDF]

[13] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 839--844, March 2010. [138.pdf]