List of works
この検索内の頻出タグ: characterization:7 srams:4 20-nm:2 comparative:2 muon-induced:2 neutrons:2 rate:2 single-event:2 soft:2 upsets:2 0.3v:1 alpha:1 alpha-particles:1 analysis:1 bulk:1 chalcogenide:1 challenges:1 cosmic:1 crossbar:1 error:1 errors:1 fpga:1 mcu:1 ml-assisted:1 modulation:1 nbti:1 neutron-induced:1 nonvolatile:1 operation:1 opportunities:1
- 論文誌
- [1] T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles," IEEE Transactions on Nuclear Science, volume 68, number 7, pages 1436-1444, July 2021. [pdf]
- 国際会議
- [1] M. Hashimoto, R. Yasuda, K. Takami, Y. Gomi, and K. Takeuchi, "ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), 379 - 384, January 2025. [pdf]
- [2] M. Hashimoto, "Characterization and Understanding of Cosmic Ray-Induced Soft Errors in SRAMs," Proceedings of International Meeting for Future of Electron Devices, Kansai, November 2024. [pdf]
- [3] T. Kato, M. Tampo, S. Takeshita, Y. Miyake, H Tanaka, and M. Hashimoto, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles," IEEE Nuclear and Space Radiation Effects Conference (NSREC), November 2020.
- [4] H. Numata, N. Banno, K. Okamoto, N. Iguchi, H. Hada, M. Hashimoto, T. Sugibayashi, T. Sakamoto, and M. Tada, "Characterization of Chalcogenide Selectors for Crossbar Switch Used in Nonvolatile FPGA," Proceedings of Silicon Nanoelectronics Workshop, June 2019. [pdf]
- [5] S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.
- [6] R. Harada, M. Hashimoto, and T. Onoye, "NBTI Characterization Using Pulse-Width Modulation," IEEE/ACM Workshop on Variability Modeling and Characterization, November 2013.