: T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles, July 2021.
Detail of a work
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| T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles," IEEE Transactions on Nuclear Science, 68(7), pp. 1436-1444, July 2021. | |
| ID | 572 |
| 分類 | 論文誌 |
| タグ | 20-nm alpha characterization comparative muon-induced neutrons particles single-event srams upsets |
| 表題 (title) |
Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles |
| 表題 (英文) |
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| 著者名 (author) |
T. Kato,M. Tampo,S. Takeshita,H. Tanaka,H. Matsuyama,M. Hashimoto,Y. Miyake |
| 英文著者名 (author) |
T. Kato,M. Tampo,,,H. Matsuyama,M. Hashimoto,Y. Miyake |
| キー (key) |
T. Kato,M. Tampo,,,H. Matsuyama,M. Hashimoto,Y. Miyake |
| 定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
68 |
| 号数 (number) |
7 |
| ページ範囲 (pages) |
1436-1444 |
| 刊行月 (month) |
7 |
| 出版年 (year) |
2021 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id572,
title = {Muon-Induced Single-Event Upsets in {20-nm} {SRAMs:} Comparative Characterization with Neutrons and Alpha Particles},
author = {T. Kato and M. Tampo and S. Takeshita and H. Tanaka and H. Matsuyama and M. Hashimoto and Y. Miyake},
journal = {IEEE Transactions on Nuclear Science},
volume = {68},
number = {7},
pages = {1436-1444},
month = {7},
year = {2021},
}
|