Detail of a work
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T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles," IEEE Transactions on Nuclear Science, 68(7), pp. 1436-1444, July 2021. | |
ID | 572 |
分類 | 論文誌 |
タグ | 20-nm alpha characterization comparative muon-induced neutrons particles single-event srams upsets |
表題 (title) |
Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles |
表題 (英文) |
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著者名 (author) |
T. Kato,M. Tampo,S. Takeshita,H. Tanaka,H. Matsuyama,M. Hashimoto,Y. Miyake |
英文著者名 (author) |
T. Kato,M. Tampo,,,H. Matsuyama,M. Hashimoto,Y. Miyake |
キー (key) |
T. Kato,M. Tampo,,,H. Matsuyama,M. Hashimoto,Y. Miyake |
定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
定期刊行物名 (英文) |
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巻数 (volume) |
68 |
号数 (number) |
7 |
ページ範囲 (pages) |
1436-1444 |
刊行月 (month) |
7 |
出版年 (year) |
2021 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id572, title = {Muon-Induced Single-Event Upsets in {20-nm} {SRAMs:} Comparative Characterization with Neutrons and Alpha Particles}, author = {T. Kato and M. Tampo and S. Takeshita and H. Tanaka and H. Matsuyama and M. Hashimoto and Y. Miyake}, journal = {IEEE Transactions on Nuclear Science}, volume = {68}, number = {7}, pages = {1436-1444}, month = {7}, year = {2021}, } |