Table of works
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26 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| Academic Journal |
, , , , , , , Y. Watanabe, S. Abe, W. Liao, M. Tampo, , , Y. Miyake, M. Hashimoto |
Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files |
IEEE Transactions on Nuclear Science | 72(8) |
2751 - 2762 |
August 2025 |
pdf | |
| Academic Journal |
J. Chen, H. Kando, T. Kanamoto, , M. Hashimoto |
A Multi-Core Chip Load Model for PDN Analysis Considering Voltage-Current-Timing Interdependency and Operation Mode Transitions |
IEEE Transactions on Components, Packaging and Manufacturing Technology | 9(9) |
1669--1679 |
September 2019 |
pdf | |
| Academic Journal |
T. Nakayama, M. Hashimoto |
Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences | 102-A(7) |
914--917 |
July 2019 |
pdf | |
| Academic Journal |
W. Liao, M. Hashimoto, S. Manabe, S. Abe, Y. Watanabe |
Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM |
IEEE Transactions on Nuclear Science | 66(7) |
1390 -- 1397 |
July 2019 |
pdf | |
| Academic Journal |
H. Fuketa, R. Harada, M. Hashimoto, T. Onoye |
Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM |
IEEE Transactions on Device and Materials Reliability | 14(1) |
463 -- 470 |
March 2014 |
185.pdf | |
| Academic Journal |
T. Enami, K. Shinkai, S. Ninomiya, S. Abe, M. Hashimoto |
Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences | E93-A(12) |
2399--2408 |
December 2010 |
148.pdf | |
| Academic Journal |
Z. Huang, A. Kurokawa, M. Hashimoto, T. Sato, M. Jiang, Y. Inoue |
Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies |
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 29(2) |
250--260 |
February 2010 |
134.pdf | |
| Academic Journal |
T. Enami, S. Ninomiya, M. Hashimoto |
Statistical Timing Analysis Considering Spatially and Temporally Correlated Dynamic Power Supply Noise |
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 28(4) |
541 - 553 |
April 2009 |
118.pdf | |
| Academic Journal |
M. Hashimoto, J. Yamaguchi, T. Sato, H. Onodera |
Timing Analysis Considering Temporal Supply Voltage Fluctuation |
IEICE Trans. on Information and Systems | E91-D(3) |
655--660 |
March 2008 |
101.pdf | |
| Academic Journal |
T. Sato, J. Ichimiya, N. Ono, K. Hachiya, M. Hashimoto |
On-Chip Thermal Gradient Analysis and Temperature Flattening for SoC Design |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences | E88-A(12) |
3382-3389 |
December 2005 |
9.pdf | |
| Academic Journal |
M. Hashimoto, Y. Yamada, H. Onodera |
Equivalent Waveform Propagation for Static Timing Analysis |
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 23(4) |
498-508 |
April 2004 |
20.pdf | |
| International Conference |
|
Window Function-Less DFT with Reduced Noise and Latency for Real-Time Music Analysis |
Proceedings of European Signal Processing Conference (EUSIPCO) | (accepted, to appear) |
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| International Conference |
, , , , , , , M. Hashimoto |
Tenpura: a General Transient Fault Evaluation and Scope Narrowing Platform for Ultra-Fast Reliability Analysis |
Proceedings of International Conference on Computer-Aided Design (ICCAD) | (accepted, to appear) |
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| International Conference |
and |
Gundam: a Generalized Unified Design and Analysis Model for Matrix Multiplication on Edge |
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC) | (accepted, to appear) |
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| International Conference |
|
Genshin: a Generalized Framework with Software-Hardware Co-Design and Pruned Fault Injection for Reliability Analysis |
Proceedings of International Test Conference (ITC) | September 2025 |
pdf | |||
| International Conference |
|
Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2024 |
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| International Conference |
|
Processor SER Estimation with ACE Bit Analysis |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2021 |
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| International Conference |
Y. Zhang, , , , , M. Hashimoto |
Fault Mode Analysis of Neural Network-Based Object Detection on GPUs with Neutron Irradiation Test |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | October 2020 |
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| International Conference |
W. Liao, M. Hashimoto, S. Manabe, S. Abe, Y. Watanabe |
Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2018 |
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| International Conference |
M. Hashimoto, Y. Nakazawa, R. Doi, J. Yu |
Interconnect Delay Analysis for RRAM Crossbar Based FPGA (Invited) |
Proceedings of IEEE Computer Society Annual Symposium on VLSI (ISVLSI) | July 2018 |
pdf | |||
| International Conference |
J. Chen, T. Kanamoto, H. Kando, M. Hashimoto |
An On-Chip Load Model for Off-Chip PDN Analysis Considering Interdependency between Supply Voltage, Current Profile and Clock Latency |
Proceedings of IEEE Workshop on Signal and Power Integrity (SPI) | May 2018 |
pdf | |||
| International Conference |
T. Nakayama, M. Hashimoto |
Hold Violation Analysis for Functional Test of Ultra-Low Temperature Circuits at Room Temperature |
Proceedings of International Symposium on VLSI Design, Automation and Test (VLSI-DAT) | April 2018 |
pdf | |||
| International Conference |
S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, Y. Watanabe |
Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation |
IEEE Nuclear and Space Radiation Effects Conference (NSREC) | July 2015 |
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| International Conference |
T. Sato, N. Ono, J. Ichimiya, K. Hachiya, M. Hashimoto |
On-Chip Thermal Gradient Analysis and Temperature Flattening for SoC Design |
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC) | 1074-1077 |
January 2005 |
34.pdf | ||
| International Conference |
A. Muramatsu, M. Hashimoto, H. Onodera |
LSI Power Network Analysis with On-Chip Wire Inductance |
Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI) | 55-60 |
October 2004 |
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| Domestic Conference |
, R. Doi, M. Hashimoto |
Rc Extraction-Free Wiring Delay Analysis Focusing on Number of On-State Switches for Via-Switch Fpga |
情報処理学会DAシンポジウム | August 2019 |