Table of works
Frequent tags in this search: srams:3 12-nm:2 analysis:2 cell:2 different:2 finfet:2 muon-induced:2 seu:2 simulation:2 types:2 28-nm:1 files:1 planar:1 register:1
2 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| Academic Journal |
, , , , , , , Y. Watanabe, S. Abe, W. Liao, M. Tampo, , , Y. Miyake, M. Hashimoto |
Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files |
IEEE Transactions on Nuclear Science | (accepted, to appear) |
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| International Conference |
|
Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2024 |