Language: 英語 | 日本語 || ログイン |

1 件の該当がありました. : このページのURL : HTML

Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files," IEEE Transactions on Nuclear Science, 採録済.
ID 655
分類 論文誌
タグ 12-nm 28-nm analysis cell different files finfet muon-induced planar register seu simulation srams srams types
表題 (title) Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files
表題 (英文)
著者名 (author) Y. Gomi,K. Takami,R. Mizuno,M. Niikura,R. Yasuda,Y. Deng,S. Kawase,Y. Watanabe,S. Abe,W. Liao,M. Tampo,S. Takeshita,K. Shimomura,Y. Miyake,M. Hashimoto
英文著者名 (author) ,,,,,,,Y. Watanabe,S. Abe,W. Liao,M. Tampo,,,Y. Miyake,M. Hashimoto
キー (key) ,,,,,,,Y. Watanabe,S. Abe,W. Liao,M. Tampo,,,Y. Miyake,M. Hashimoto
定期刊行物名 (journal) IEEE Transactions on Nuclear Science
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 0
出版年 (year) (to appear)
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 利用できません.
BiBTeXエントリ
@article{id655,
         title = {Muon-Induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs}, and {28-nm} Planar {SRAMs} and Register Files},
        author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and R. Yasuda and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
         month = {0},
          year = {(to appear)},
}