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Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files," IEEE Transactions on Nuclear Science, 採録済. | |
ID | 655 |
分類 | 論文誌 |
タグ | 12-nm 28-nm analysis cell different files finfet muon-induced planar register seu simulation srams srams types |
表題 (title) |
Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files |
表題 (英文) |
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著者名 (author) |
Y. Gomi,K. Takami,R. Mizuno,M. Niikura,R. Yasuda,Y. Deng,S. Kawase,Y. Watanabe,S. Abe,W. Liao,M. Tampo,S. Takeshita,K. Shimomura,Y. Miyake,M. Hashimoto |
英文著者名 (author) |
,,,,,,,Y. Watanabe,S. Abe,W. Liao,M. Tampo,,,Y. Miyake,M. Hashimoto |
キー (key) |
,,,,,,,Y. Watanabe,S. Abe,W. Liao,M. Tampo,,,Y. Miyake,M. Hashimoto |
定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
定期刊行物名 (英文) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
0 |
出版年 (year) |
(to appear) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id655, title = {Muon-Induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs}, and {28-nm} Planar {SRAMs} and Register Files}, author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and R. Yasuda and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto}, journal = {IEEE Transactions on Nuclear Science}, month = {0}, year = {(to appear)}, } |