この検索内の頻出タグ: muon-induced^:2 srams^:2 12-nm^:1 28-nm^:1 65-nm^:1 bulk^:1 cross^:1 event^:1 finfet^:1 impact^:1 irradiation^:1 planar^:1 sections^:1 seu^:1 side^:1 single^:1 upsets^:1

2 件の該当がありました． : このページのURL : HTML

論文誌

[1] Y. Deng, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, and Y. Miyake, "Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs," IEEE Transactions on Nuclear Science, volume 71, number 4, pages 912-920, April 2024. [pdf]

国際会議

[1] Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2023.