: Y. Deng, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, and Y. Miyake, Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs, April 2024.
Detail of a work
| Tweet | |
| Y. Deng, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, and Y. Miyake, "Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs," IEEE Transactions on Nuclear Science, 71(4), pp. 912-920, April 2024. | |
| ID | 629 |
| 分類 | 論文誌 |
| タグ | 65-nm bulk event impact irradiation muon-induced side single srams upsets |
| 表題 (title) |
Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs |
| 表題 (英文) |
|
| 著者名 (author) |
Y. Deng,Y. Watanabe,S. Manabe,W. Liao,M. Hashimoto,S. Abe,M. Tampo,Y. Miyake |
| 英文著者名 (author) |
,Y. Watanabe,S. Manabe,W. Liao,M. Hashimoto,S. Abe,M. Tampo,Y. Miyake |
| キー (key) |
,Y. Watanabe,S. Manabe,W. Liao,M. Hashimoto,S. Abe,M. Tampo,Y. Miyake |
| 定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
| 定期刊行物名 (英文) |
|
| 巻数 (volume) |
71 |
| 号数 (number) |
4 |
| ページ範囲 (pages) |
912-920 |
| 刊行月 (month) |
4 |
| 出版年 (year) |
2024 |
| Impact Factor (JCR) |
|
| URL |
|
| 付加情報 (note) |
|
| 注釈 (annote) |
|
| 内容梗概 (abstract) |
|
| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id629,
title = {Impact of Irradiation Side on Muon-Induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
author = {Y. Deng and Y. Watanabe and S. Manabe and W. Liao and M. Hashimoto and S. Abe and M. Tampo and Y. Miyake},
journal = {IEEE Transactions on Nuclear Science},
volume = {71},
number = {4},
pages = {912-920},
month = {4},
year = {2024},
}
|