Frequent tags in this search: muon-induced^:15 srams^:13 seu^:8 65-nm^:7 bulk^:7 negative^:5 upsets^:5 cross^:4 12-nm^:3 28-nm^:3 finfet^:3 impact^:3 planar^:3 positive^:3 sections^:3 20-nm^:2 analysis^:2 angle^:2 cell^:2 characterization^:2 comparative^:2 different^:2 estimation^:2 event^:2 measurement^:2 neutrons^:2 nuclear^:2 rates^:2 simulation^:2 single^:2

15 publications are found. : URL for this page. : HTML

@article{id655,
         title = {Muon-Induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs}, and {28-nm} Planar {SRAMs} and Register Files},
        author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and R. Yasuda and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {72},
        number = {8},
         pages = {2751 - 2762},
         month = {8},
          year = {2025},
}

@article{id629,
         title = {Impact of Irradiation Side on Muon-Induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {Y. Deng and Y. Watanabe and S. Manabe and W. Liao and M. Hashimoto and S. Abe and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {71},
        number = {4},
         pages = {912-920},
         month = {4},
          year = {2024},
}

@article{id572,
         title = {Muon-Induced Single-Event Upsets in {20-nm} {SRAMs:} Comparative Characterization with Neutrons and Alpha Particles},
        author = {T. Kato and M. Tampo and S. Takeshita and H. Tanaka and H. Matsuyama and M. Hashimoto and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {68},
        number = {7},
         pages = {1436-1444},
         month = {7},
          year = {2021},
}

@article{id540,
         title = {Impact of the Angle of Incidence on Negative Muon-induced {SEU} Cross Sections of {65-nm} Bulk and {FDSOI} {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1566 -- 1572},
         month = {7},
          year = {2020},
}

@article{id511,
         title = {Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and S. Abe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1398 -- 1403},
         month = {7},
          year = {2019},
}

@article{id476,
         title = {Negative and Positive Muon-Induced Single Event Upsets in {65-nm} {UTBB} {SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and K. Nakano and H. Sato and T. Kin and S. Abe and K. Hamada and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {65},
        number = {8},
         pages = {1742--1749},
         month = {8},
          year = {2018},
}

@article{id477,
         title = {Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in {65-nm} Bulk {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {65},
        number = {8},
         pages = {1734--1741},
         month = {8},
          year = {2018},
}

@article{id637,
         title = {Muon-induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs}},
        author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and R. Yasuda and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2024},
}

@article{id618,
         title = {Muon-Induced {SEU} Cross Sections of {12-nm} {FinFET} and {28-nm} Planar {SRAMs}},
        author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and I. Umegaki and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2023},
}

@article{id632,
         title = {Nuclear physics for muon-induced soft error},
        author = {M. Niikura and   R. Mizuno and  S. Manabe and  T. Y. Saito and  T. Matsuzaki and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  A. Hillier and  N. Kawamura and  Y. Kawashima and  S. Kawase and  T. Kawata and  K. Kitafuji and  F. Minato and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  M. Tampo and  D. Tomono and  I. Umegaki and  Y. Yamaguchi and  Y. Watanabe},
       journal = {Workshop for Computational Technique for Negative Muon Spectroscopy and Elemental Analysis},
         month = {8},
          year = {2023},
}

@article{id630,
         title = {Measurement of muon-induced nuclear transmutation for Si isotopes},
        author = {R. Mizuno and  M. Niikura and  T. Y. Saito and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  N. Kawamura and  S. Kawase and  T. Matsuzaki and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  I. Umegaki},
       journal = {Trans-scale Quantum Science Institute},
         month = {11},
          year = {2022},
}

@article{id545,
         title = {Muon-Induced Single-Event Upsets in {20-nm} {SRAMs:} Comparative Characterization with Neutrons and {Alpha-Particles}},
        author = {T. Kato and M. Tampo and S. Takeshita and Y. Miyake and H Tanaka and M. Hashimoto},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {11},
          year = {2020},
}

@article{id520,
         title = {Impact of Incident Angle on Negative Muon-induced {SEU} Cross Section of {65-nm} Bulk {SRAM}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id500,
         title = {Negative and Positive Muon-induced {SEU} Cross Sections in {28-nm} and {65-nm} Planar Bulk {CMOS} {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {4},
          year = {2019},
}

@article{id482,
         title = {Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and S. Abe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}