Detail of a work
Tweet | |
S. Watanabe, M. Hashimoto, and T. Sato, "A Case for Exploiting Complex Arithmetic Circuits Towards Performance Yield Enhancement," Proceedings of International Symposium on Quality Electronic Design (ISQED), pp. 401--407, March 2009. | |
ID | 229 |
分類 | 国際会議 |
タグ | |
表題 (title) |
A Case for Exploiting Complex Arithmetic Circuits Towards Performance Yield Enhancement |
表題 (英文) |
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著者名 (author) |
S. Watanabe,M. Hashimoto,T. Sato |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
Proceedings of International Symposium on Quality Electronic Design (ISQED) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
401--407 |
刊行月 (month) |
3 |
出版年 (year) |
2009 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 122.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id229, title = {A Case for Exploiting Complex Arithmetic Circuits towards Performance Yield Enhancement}, author = {S. Watanabe and M. Hashimoto and T. Sato}, journal = {Proceedings of International Symposium on Quality Electronic Design (ISQED)}, pages = {401--407}, month = {3}, year = {2009}, } |