Table of works
Frequent tags in this search: srams:6 finfet:5 12-nm:4 planar:4 seu:4 muon-induced:3 28-nm:2 analysis:2 cell:2 cross:2 different:2 simulation:2 types:2 20-nm:1 angular:1 bulk:1 comparison:1 dependence:1 files:1 let:1 model:1 neutron-induced:1 register:1 reproducing:1 section:1 sections:1 sensitivity:1 single-event:1 upsets:1 voltage:1
5 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| Academic Journal |
, , , , , , , Y. Watanabe, S. Abe, W. Liao, M. Tampo, , , Y. Miyake, M. Hashimoto |
Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files |
IEEE Transactions on Nuclear Science | (accepted, to appear) |
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| Academic Journal |
T. Kato, M. Hashimoto, H. Matsuyama |
Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs with Comparison to 20-nm Planar SRAMs |
IEEE Transactions on Nuclear Science | 67(7) |
1485 -- 1493 |
July 2020 |
pdf | |
| International Conference |
|
Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2024 |
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| International Conference |
, T. Kato, M. Hashimoto |
An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs |
Proceedings of International Symposium on Reliability Physics (IRPS) | April 2024 |
pdf | |||
| International Conference |
, , , , , , Y. Watanabe, S. Abe, W. Liao, M. Tampo, , , , Y. Miyake, M. Hashimoto |
Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2023 |