: K. Takeuchi, T. Kato, and M. Hashimoto, An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs, April 2024.
Detail of a work
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| K. Takeuchi, T. Kato, and M. Hashimoto, "An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs," Proceedings of International Symposium on Reliability Physics (IRPS), April 2024. | |
| ID | 627 |
| 分類 | 国際会議 |
| タグ | bulk cross dependence finfet let model planar reproducing section seu srams voltage |
| 表題 (title) |
An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs |
| 表題 (英文) |
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| 著者名 (author) |
K. Takeuchi,T. Kato,M. Hashimoto |
| 英文著者名 (author) |
,T. Kato,M. Hashimoto |
| キー (key) |
,T. Kato,M. Hashimoto |
| 定期刊行物名 (journal) |
Proceedings of International Symposium on Reliability Physics (IRPS) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
4 |
| 出版年 (year) |
2024 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id627,
title = {An {SEU} Cross Section Model Reproducing {LET} and Voltage Dependence in Bulk Planar and {FinFET} {SRAMs}},
author = {K. Takeuchi and T. Kato and M. Hashimoto},
journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
month = {4},
year = {2024},
}
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