この検索内の頻出タグ: simulation^:8 srams^:5 irradiation^:4 neutron^:4 ser^:4 terrestrial^:4 coupled^:3 one-time^:3 12-^:2 12-nm^:2 28-nm^:2 analysis^:2 cell^:2 different^:2 estimated^:2 estimation^:2 finfet^:2 measurement^:2 methodology^:2 muon-induced^:2 seu^:2 types^:2 validating^:2 28-^:1 65-nm^:1 applicable^:1 average^:1 characterizing^:1 conventional^:1 delay^:1

8 件の該当がありました． : このページのURL : HTML

論文誌

[1] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12-, 28- and 65-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," IEEE Transactions on Nuclear Science, 採録済.

[2] Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files," IEEE Transactions on Nuclear Science, 採録済.

[3] S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, "A Terrestrial SER Estimation Methodology Based on Simulation Coupled with One-Time Neutron Irradiation Testing," IEEE Transactions on Nuclear Science, volume 70, number 8, 1652 -- 1657, August 2023. [pdf]

[4] M. Hashimoto, K. Kobayashi, J. Furuta, S. Abe, and Y. Watanabe, "Characterizing SRAM and FF Soft Error Rates with Measurement and Simulation (Invited)," Integration, the VLSI Journal, volume 69, pages 161--179, November 2019. [pdf]

[5] Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, "Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop with On-Chip Delay Measurement," IEEE Transactions on Circuits and Systems II, volume 54, number 10, pages 868--872, October 2007. [94.pdf]

国際会議

[1] Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.

[2] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.

[3] S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, "A Terrestrial SER Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.