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Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, "Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," IEEE Transactions on Nuclear Science, 採録済.
ID 690
分類 論文誌
タグ 22-nm 55-nm event-wise measurement multiple-cell neutron-induced quasi simulation srams upsets
表題 (title) Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs
表題 (英文)
著者名 (author) Yuibi Gomi,Kazusa Takami,Ryuichi Yasuda,Hiroki Kanda,Mitsuhiro Fukuda,Masanori Hashimoto
英文著者名 (author) ,,,,,
キー (key) ,,,,,
定期刊行物名 (journal) IEEE Transactions on Nuclear Science
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刊行月 (month) 0
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BiBTeXエントリ
@article{id690,
         title = {Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in {22-nm} and {55-nm} {SRAMs}},
        author = {Yuibi Gomi and Kazusa Takami and Ryuichi Yasuda and Hiroki Kanda and Mitsuhiro Fukuda and Masanori Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
         month = {0},
          year = {(to appear)},
}