この検索内の頻出タグ: estimation^:18 noise^:5 delay^:3 ser^:3 65-nm^:2 bulk^:2 crosstalk^:2 dynamic^:2 error^:2 gate^:2 generic^:2 irradiation^:2 learning^:2 machine^:2 methodology^:2 muon-induced^:2 neutron^:2 power^:2 rate^:2 rates^:2 rc^:2 seu^:2 simulation^:2 soft^:2 srams^:2 sta^:2 supply^:2 terrestrial^:2 trees^:2 utbb-soi^:2

18 件の該当がありました． : このページのURL : HTML

論文誌

[1] S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, "A Terrestrial SER Estimation Methodology Based on Simulation Coupled with One-Time Neutron Irradiation Testing," IEEE Transactions on Nuclear Science, volume 70, number 8, 1652 -- 1657, August 2023. [pdf]

[2] Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, "Vulnerability Estimation of DNN Model Parameters with Few Fault Injections," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E106-A, number 3, pages 523-531, March 2023. [pdf]

[3] S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, and S. Abe, "Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs," IEEE Transactions on Nuclear Science, volume 66, number 7, 1398 -- 1403, July 2019. [pdf]

[4] T. Okumura, F. Minami, K. Shimazaki, K. Kuwada, and M. Hashimoto, "Gate Delay Estimation in STA under Dynamic Power Supply Noise," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 12, pages 2447--2455, December 2010. [151.pdf]

[5] T. Kanamoto, S. Akutsu, T. Nakabayashi, T. Ichinomiya, K. Hachiya, A. Kurokawa, H. Ishikawa, S. Muromoto, H. Kobayashi, and M. Hashimoto, "Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3666-3670, December 2006. [5.pdf]

[6] M. Hashimoto, M. Takahashi, and H. Onodera, "Crosstalk Noise Estimation for Generic RC Trees," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E86-A, number 12, pages 2965-2973, December 2003. [13.pdf]

国際会議

[1] S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, "A Terrestrial SER Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.

[2] T. Hsu, D. Yang, W. Liao, M. Itoh, M. Hashimoto, , and J. Liou, "Processor SER Estimation with ACE Bit Analysis," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2021.

[3] R. Shimizu, R. Shirai, and M. Hashimoto, "Position and Posture Estimation of Capsule Endoscopy with a Single Wearable Coil Toward Daily Life Diagnosis," Proceedings of International Midwest Symposium on Circuits and Systems (MWSCAS), pages 57--60, August 2020. [pdf]

[4] H. Awano and M. Hashimoto, "BYNQNet: Bayesian Neural Network with Quadratic Activations for Sampling-Free Uncertainty Estimation on FPGA," Proceedings of Design, Automation and Test in Europe Conference (DATE), April 2020. [pdf]

[5] S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, and S. Abe, "Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2018.

[6] M. Hashimoto, W. Liao, and S. Hirokawa, "Soft Error Rate Estimation with TCAD and Machine Learning (Invited)," Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), September 2017. [pdf]

[7] S. Hirokawa, R. Harada, K. Sakuta, Y. Watanabe, and M. Hashimoto, "Multiple Sensitive Volume Based Soft Error Rate Estimation with Machine Learning," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2016. [pdf]

[8] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 646--651, March 2010. [137.pdf]

[9] T. Okumura, F. Minami, K. Shimazaki, K. Kuwada, and M. Hashimoto, "Gate Delay Estimation in STA under Dynamic Power Supply Noise," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), 775 -- 780, January 2010. [132.pdf]

[10] S. Uemura, T. Miyazaki, M. Hashimoto, and H. Onodera, "Estimation of Maximum Oscillation Frequency for CMOS LCVCOs," In Proceedings of IEEJ International Analog VLSI Workshop, October 2005.

[11] M. Takahashi, M. Hashimoto, and H. Onodera, "Crosstalk Noise Estimation for Generic RC Trees," In Proceedings of International Conference on Computer Design (ICCD), pages 110-116, September 2001. [58.pdf]

研究会・全国大会等

[1] S. Iizuka, Y. Higuchi, M. Hashimoto, and T. Onoye, "Area Efficient Device-Parameter Estimation Using Sensitivity-Configurable Ring Oscillator," 電子情報通信学会 VLSI設計技術研究会, March 2015.