この検索内の頻出タグ: estimated^:3 12-^:2 coupled^:2 irradiation^:2 neutron^:2 one-time^:2 ser^:2 simulation^:2 srams^:2 terrestrial^:2 validating^:2 28-^:1 28-nm^:1 65-nm^:1 accurately^:1 ai^:1 be^:1 black-box/white-box^:1 can^:1 case^:1 cases?^:1 edge^:1 error^:1 how^:1 impact^:1 soc^:1 soft^:1 study^:1

3 件の該当がありました． : このページのURL : HTML

論文誌

[1] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12-, 28- and 65-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," IEEE Transactions on Nuclear Science, volume 72, number 8, pages 2622-2628, August 2025. [pdf]

国際会議

[1] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.

[2] Q. Cheng, Q. Li, L. Lin, W. Liao, L. Dai, H. Yu, and M. Hashimoto, "How Accurately Can Soft Error Impact Be Estimated in Black-Box/White-Box Cases? -- a Case Study with an Edge AI SoC --," Proceedings of Design Automation Conference (DAC), June 2024. [pdf]