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国際会議

[1] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.

[2] Q. Cheng, Q. Li, L. Lin, W. Liao, L. Dai, H. Yu, and M. Hashimoto, "How Accurately Can Soft Error Impact Be Estimated in Black-Box/White-Box Cases? -- a Case Study with an Edge AI SoC --," Proceedings of Design Automation Conference (DAC), June 2024. [pdf]