この検索内の頻出タグ: 12-^:3 srams^:3 28-nm^:2 coupled^:2 estimated^:2 irradiation^:2 neutron^:2 one-time^:2 ser^:2 simulation^:2 terrestrial^:2 validating^:2 14.8^:1 28-^:1 6.0^:1 65-nm^:1 8.0^:1 characterizing^:1 cross^:1 mev^:1 neutrons^:1 sections^:1 seu^:1

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論文誌

[1] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12-, 28- and 65-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," IEEE Transactions on Nuclear Science, 採録済.

国際会議

[1] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.

[2] K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, and M. Hashimoto, "Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons," Proceedings of International Reliability Physics Symposium (IRPS), March 2023. [pdf]