この検索内の頻出タグ: neutron^:12 irradiation^:7 errors^:4 induced^:4 65-nm^:3 fault^:3 sram^:3 test^:3 upsets^:3 10t^:2 analyzing^:2 angular^:2 cell^:2 control^:2 dependency^:2 due^:2 error^:2 estimation^:2 flow^:2 gpus^:2 high-energy^:2 injection^:2 methodology^:2 multiple^:2 ser^:2 simulation^:2 single^:2 subthreshold^:2 terrestrial^:2 -secded^:1

12 件の該当がありました． : このページのURL : HTML

論文誌

[1] S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, "A Terrestrial SER Estimation Methodology Based on Simulation Coupled with One-Time Neutron Irradiation Testing," IEEE Transactions on Nuclear Science, volume 70, number 8, 1652 -- 1657, August 2023. [pdf]

[2] K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, "Analyzing DUE Errors on GPUs with Neutron Irradiation Test and Fault Injection to Control Flow," IEEE Transactions on Nuclear Science, volume 68, number 8, pages 1668--1674, August 2021. [pdf]

[3] R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, "Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," IEEE Transactions on Nuclear Science, volume 59, number 6, pages 2791--2795, December 2012. [175.pdf]

国際会議

[1] M. Yoshida, R. Iwamoto, M. Itoh, and M. Hashimoto, "Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2023.

[2] S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, "A Terrestrial SER Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.

[3] K. Ito, H. Itsuji, T. Uezono, T. Toba, M. Itoh, and M. Hashimoto, "Constructing Application-Level GPU Error Rate Model with Neutron Irradiation Experiment," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.

[4] M. Kamibayashi, K. Kobayashi, and M. Hashimoto, "Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective-," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.

[5] Y. Zhang, K. Ito, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, "Fault Mode Analysis of Neural Network-Based Object Detection on GPUs with Neutron Irradiation Test," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2020.

[6] K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, "Analyzing DUE Errors with Neutron Irradiation Test and Fault Injection to Control Flow," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2020.

[7] M. Hashimoto, W. Liao, S. Manabe, and Y. Watanabe, "Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited)," Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), October 2018. [pdf]

[8] T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, "Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. [215.pdf]

[9] R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, "Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2012.