Table of works
Frequent tags in this search: neutron:14 irradiation:9 65-nm:4 errors:4 induced:4 ser:4 simulation:4 terrestrial:4 coupled:3 fault:3 one-time:3 sram:3 srams:3 test:3 upsets:3 10t:2 12-:2 analyzing:2 angular:2 cell:2 control:2 dependency:2 due:2 error:2 estimated:2 estimation:2 flow:2 gpus:2 high-energy:2 injection:2
14 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| Academic Journal |
, , , S. Abe, , , M. Fukuda, M. Hashimoto |
Validating Terrestrial SER in 12-, 28- and 65-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation |
IEEE Transactions on Nuclear Science | 72(8) |
2622-2628 |
August 2025 |
pdf | |
| Academic Journal |
S. Abe, M. Hashimoto, W. Liao, T. Kato, , , H. Matsuyama, T. Sato, K. Kobayashi, Y. Watanabe |
A Terrestrial SER Estimation Methodology Based on Simulation Coupled with One-Time Neutron Irradiation Testing |
IEEE Transactions on Nuclear Science | 70(8) |
1652 -- 1657 |
August 2023 |
pdf | |
| Academic Journal |
, Y. Zhang, , , , M. Hashimoto |
Analyzing DUE Errors on GPUs with Neutron Irradiation Test and Fault Injection to Control Flow |
IEEE Transactions on Nuclear Science | 68(8) |
1668--1674 |
August 2021 |
pdf | |
| Academic Journal |
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, Y. Watanabe |
Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM |
IEEE Transactions on Nuclear Science | 59(6) |
2791--2795 |
December 2012 |
175.pdf | |
| International Conference |
|
Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2024 |
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| International Conference |
, , , M. Hashimoto |
Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2023 |
||||
| International Conference |
S. Abe, M. Hashimoto, W. Liao, T. Kato, , , H. Matsuyama, T. Sato, K. Kobayashi, Y. Watanabe |
A Terrestrial SER Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | October 2022 |
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| International Conference |
, , , , , M. Hashimoto |
Constructing Application-Level GPU Error Rate Model with Neutron Irradiation Experiment |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | October 2022 |
pdf | |||
| International Conference |
, K. Kobayashi, M. Hashimoto |
Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective- |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | October 2022 |
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| International Conference |
Y. Zhang, , , , , M. Hashimoto |
Fault Mode Analysis of Neural Network-Based Object Detection on GPUs with Neutron Irradiation Test |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | October 2020 |
||||
| International Conference |
, Y. Zhang, , , , M. Hashimoto |
Analyzing DUE Errors with Neutron Irradiation Test and Fault Injection to Control Flow |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | October 2020 |
||||
| International Conference |
M. Hashimoto, W. Liao, S. Manabe, Y. Watanabe |
Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited) |
Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) | October 2018 |
pdf | |||
| International Conference |
T. Uemura, T. Kato, S. Okano, H. Matsuyama, M. Hashimoto |
Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM |
Proceedings of International Symposium on Reliability Physics (IRPS) | April 2015 |
215.pdf | |||
| International Conference |
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, Y. Watanabe |
Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM |
IEEE Nuclear and Space Radiation Effects Conference (NSREC) | July 2012 |