: M. Hashimoto, W. Liao, S. Manabe, and Y. Watanabe, Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited), October 2018.
Detail of a work
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| M. Hashimoto, W. Liao, S. Manabe, and Y. Watanabe, "Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited)," Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), October 2018. | |
| ID | 496 |
| 分類 | 国際会議 |
| タグ | 65-nm beams bulk characterizing error muon neutron rates soft sotb srams |
| 表題 (title) |
Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited) |
| 表題 (英文) |
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| 著者名 (author) |
M. Hashimoto,W. Liao,S. Manabe,Y. Watanabe |
| 英文著者名 (author) |
M. Hashimoto,W. Liao,S. Manabe,Y. Watanabe |
| キー (key) |
M. Hashimoto,W. Liao,S. Manabe,Y. Watanabe |
| 定期刊行物名 (journal) |
Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
10 |
| 出版年 (year) |
2018 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id496,
title = {Characterizing soft error rates of {65-nm} {SOTB} and bulk {SRAMs} with muon and neutron beams (Invited)},
author = {M. Hashimoto and W. Liao and S. Manabe and Y. Watanabe},
journal = {Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)},
month = {10},
year = {2018},
}
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