Detail of a work
Tweet | |
M. Hashimoto, W. Liao, S. Manabe, and Y. Watanabe, "Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited)," Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), October 2018. | |
ID | 496 |
分類 | 国際会議 |
タグ | 65-nm beams bulk characterizing error muon neutron rates soft sotb srams |
表題 (title) |
Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited) |
表題 (英文) |
|
著者名 (author) |
M. Hashimoto,W. Liao,S. Manabe,Y. Watanabe |
英文著者名 (author) |
M. Hashimoto,W. Liao,S. Manabe,Y. Watanabe |
キー (key) |
M. Hashimoto,W. Liao,S. Manabe,Y. Watanabe |
定期刊行物名 (journal) |
Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) |
定期刊行物名 (英文) |
|
巻数 (volume) |
|
号数 (number) |
|
ページ範囲 (pages) |
|
刊行月 (month) |
10 |
出版年 (year) |
2018 |
Impact Factor (JCR) |
|
URL |
|
付加情報 (note) |
|
注釈 (annote) |
|
内容梗概 (abstract) |
|
論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id496, title = {Characterizing soft error rates of {65-nm} {SOTB} and bulk {SRAMs} with muon and neutron beams (Invited)}, author = {M. Hashimoto and W. Liao and S. Manabe and Y. Watanabe}, journal = {Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)}, month = {10}, year = {2018}, } |