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M. Hashimoto, W. Liao, S. Manabe, and Y. Watanabe, "Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited)," Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), October 2018.
ID 496
分類 国際会議
タグ 65-nm beams bulk characterizing error muon neutron rates soft sotb srams
表題 (title) Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited)
表題 (英文)
著者名 (author) M. Hashimoto,W. Liao,S. Manabe,Y. Watanabe
英文著者名 (author) M. Hashimoto,W. Liao,S. Manabe,Y. Watanabe
キー (key) M. Hashimoto,W. Liao,S. Manabe,Y. Watanabe
定期刊行物名 (journal) Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 10
出版年 (year) 2018
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id496,
         title = {Characterizing soft error rates of {65-nm} {SOTB} and bulk {SRAMs} with muon and neutron beams (Invited)},
        author = {M. Hashimoto and W. Liao and S. Manabe and Y. Watanabe},
       journal = {Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)},
         month = {10},
          year = {2018},
}