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3 publications are found. : URL for this page. : HTML


Author (author) Title (title) Journal/Conference Volume / Number Pages (pages) Published date Impact factor / Acceptance File
Academic Journal
, Y. Zhang, , , , M. Hashimoto
Analyzing DUE Errors on GPUs with Neutron Irradiation Test and Fault Injection to Control Flow
IEEE Transactions on Nuclear Science
68(8)
1668--1674
August 2021

pdf
Academic Journal
W. Liao, M. Hashimoto
Analyzing Impacts of SRAM, FF and Combinational Circuit on Chip-Level Neutron-Induced Soft Error Rate
IEICE Trans. on Electronics
E102-C(4)
296--302
April 2019

pdf
International Conference
, Y. Zhang, , , , M. Hashimoto
Analyzing DUE Errors with Neutron Irradiation Test and Fault Injection to Control Flow
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)


October 2020