|
Author (author) |
Title (title) |
Journal/Conference |
Volume / Number |
Pages (pages) |
Published date |
Impact factor / Acceptance |
File |
Academic Journal
|
M. Hashimoto, K. Kobayashi, , S. Abe, Y. Watanabe
|
Characterizing SRAM and FF Soft Error Rates with Measurement and Simulation (Invited)
|
Integration, the VLSI Journal
| 69
|
161--179
|
November 2019
|
| pdf
|
Academic Journal
|
W. Liao, M. Hashimoto
|
Analyzing Impacts of SRAM, FF and Combinational Circuit on Chip-Level Neutron-Induced Soft Error Rate
|
IEICE Trans. on Electronics
| E102-C(4)
|
296--302
|
April 2019
|
| pdf
|
International Conference
|
W. Liao, S. Hirokawa, R. Harada, M. Hashimoto
|
Contributions of SRAM, FF and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate -- Bulk vs. FD-SOI at 0.5 and 1.0V --
|
Proceedings of International NEWCAS Conference
|
|
33-37
|
June 2017
|
| pdf
|
International Conference
|
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
|
Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
July 2013
|
|
|