: M. Hashimoto, K. Kobayashi, J. Furuta, S. Abe, and Y. Watanabe, Characterizing SRAM and FF Soft Error Rates with Measurement and Simulation (Invited), November 2019.
Detail of a work
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| M. Hashimoto, K. Kobayashi, J. Furuta, S. Abe, and Y. Watanabe, "Characterizing SRAM and FF Soft Error Rates with Measurement and Simulation (Invited)," Integration, the VLSI Journal, 69, pp. 161--179, November 2019. | |
| ID | 508 |
| 分類 | 論文誌 |
| タグ | characterizing error ff invited measurement rates simulation soft sram |
| 表題 (title) |
Characterizing SRAM and FF Soft Error Rates with Measurement and Simulation (Invited) |
| 表題 (英文) |
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| 著者名 (author) |
M. Hashimoto,K. Kobayashi,J. Furuta,S. Abe,Y. Watanabe |
| 英文著者名 (author) |
M. Hashimoto,K. Kobayashi,,S. Abe,Y. Watanabe |
| キー (key) |
M. Hashimoto,K. Kobayashi,,S. Abe,Y. Watanabe |
| 定期刊行物名 (journal) |
Integration, the VLSI Journal |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
69 |
| 号数 (number) |
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| ページ範囲 (pages) |
161--179 |
| 刊行月 (month) |
11 |
| 出版年 (year) |
2019 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id508,
title = {Characterizing {SRAM} and {FF} Soft Error Rates with Measurement and Simulation (Invited)},
author = {M. Hashimoto and K. Kobayashi and J. Furuta and S. Abe and Y. Watanabe},
journal = {Integration, the VLSI Journal},
volume = {69},
pages = {161--179},
month = {11},
year = {2019},
}
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