Detail of a work
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M. Hashimoto, K. Kobayashi, J. Furuta, S. Abe, and Y. Watanabe, "Characterizing SRAM and FF Soft Error Rates with Measurement and Simulation (Invited)," Integration, the VLSI Journal, 69, pp. 161--179, November 2019. | |
ID | 508 |
分類 | 論文誌 |
タグ | characterizing error ff invited measurement rates simulation soft sram |
表題 (title) |
Characterizing SRAM and FF Soft Error Rates with Measurement and Simulation (Invited) |
表題 (英文) |
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著者名 (author) |
M. Hashimoto,K. Kobayashi,J. Furuta,S. Abe,Y. Watanabe |
英文著者名 (author) |
M. Hashimoto,K. Kobayashi,,S. Abe,Y. Watanabe |
キー (key) |
M. Hashimoto,K. Kobayashi,,S. Abe,Y. Watanabe |
定期刊行物名 (journal) |
Integration, the VLSI Journal |
定期刊行物名 (英文) |
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巻数 (volume) |
69 |
号数 (number) |
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ページ範囲 (pages) |
161--179 |
刊行月 (month) |
11 |
出版年 (year) |
2019 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id508, title = {Characterizing {SRAM} and {FF} Soft Error Rates with Measurement and Simulation (Invited)}, author = {M. Hashimoto and K. Kobayashi and J. Furuta and S. Abe and Y. Watanabe}, journal = {Integration, the VLSI Journal}, volume = {69}, pages = {161--179}, month = {11}, year = {2019}, } |