Table of works
Frequent tags in this search: bulk:1 cmos:1 contribution:1 ff:1 processor:1 rate:1 reliability:1 scaling:1 soft-error:1 sram:1 technology:1 their:1 trend:1
1 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| International Conference |
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto |
Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology |
IEEE Nuclear and Space Radiation Effects Conference (NSREC) | July 2013 |