Search: 簡易 | 詳細 || Language: 英語 | 日本語 || ログイン |

この検索内の頻出タグ: bulk:1 cmos:1 contribution:1 ff:1 processor:1 rate:1 reliability:1 scaling:1 soft-error:1 sram:1 technology:1 their:1 trend:1

1 件の該当がありました． : このページのURL : HTML


国際会議
[1] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.