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T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013. | |
ID | 346 |
分類 | 国際会議 |
タグ | bulk cmos contribution ff processor rate reliability scaling soft-error sram technology their trend |
表題 (title) |
Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology |
表題 (英文) |
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著者名 (author) |
T. Uemura,T. Kato,H. Matsuyama,M. Hashimoto |
英文著者名 (author) |
T. Uemura,T. Kato,H. Matsuyama,M. Hashimoto |
キー (key) |
T. Uemura,T. Kato,H. Matsuyama,M. Hashimoto |
定期刊行物名 (journal) |
IEEE Nuclear and Space Radiation Effects Conference (NSREC) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
7 |
出版年 (year) |
2013 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id346, title = {Scaling Trend of {SRAM} and {FF} of Soft-Error Rate and Their Contribution to Processor reliability on Bulk {CMOS} Technology}, author = {T. Uemura and T. Kato and H. Matsuyama and M. Hashimoto}, journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)}, month = {7}, year = {2013}, } |