: T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology, July 2013.
Detail of a work
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| T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013. | |
| ID | 346 |
| 分類 | 国際会議 |
| タグ | bulk cmos contribution ff processor rate reliability scaling soft-error sram technology their trend |
| 表題 (title) |
Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology |
| 表題 (英文) |
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| 著者名 (author) |
T. Uemura,T. Kato,H. Matsuyama,M. Hashimoto |
| 英文著者名 (author) |
T. Uemura,T. Kato,H. Matsuyama,M. Hashimoto |
| キー (key) |
T. Uemura,T. Kato,H. Matsuyama,M. Hashimoto |
| 定期刊行物名 (journal) |
IEEE Nuclear and Space Radiation Effects Conference (NSREC) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
7 |
| 出版年 (year) |
2013 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id346,
title = {Scaling Trend of {SRAM} and {FF} of Soft-Error Rate and Their Contribution to Processor reliability on Bulk {CMOS} Technology},
author = {T. Uemura and T. Kato and H. Matsuyama and M. Hashimoto},
journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
month = {7},
year = {2013},
}
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