この検索内の頻出タグ: their^:2 bits^:1 bulk^:1 cards^:1 cmos^:1 contribution^:1 drams^:1 error^:1 ff^:1 gpu^:1 neutron-induced^:1 processor^:1 rate^:1 recovery^:1 reliability^:1 scaling^:1 soft-error^:1 sram^:1 stuck^:1 technology^:1 trend^:1

2 件の該当がありました． : このページのURL : HTML

国際会議

[1] M. Hashimoto, Y. Zhang, and K. Ito, "Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards," Proceedings of International Conference on Solid State Devices and Materials (SSDM), September 2022.

[2] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.