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M. Hashimoto, Y. Zhang, and K. Ito, "Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards," Proceedings of International Conference on Solid State Devices and Materials (SSDM), September 2022.
ID 600
分類 国際会議
タグ bits cards drams error gpu neutron-induced recovery stuck their
表題 (title) Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards
表題 (英文)
著者名 (author) M. Hashimoto,Y. Zhang,K. Ito
英文著者名 (author) M. Hashimoto,Y. Zhang,
キー (key) M. Hashimoto,Y. Zhang,
定期刊行物名 (journal) Proceedings of International Conference on Solid State Devices and Materials (SSDM)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 9
出版年 (year) 2022
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id600,
         title = {Neutron-induced stuck error bits and their recovery in {DRAMs} on {GPU} cards},
        author = {M. Hashimoto and Y. Zhang and K. Ito},
       journal = {Proceedings of International Conference on Solid State Devices and Materials (SSDM)},
         month = {9},
          year = {2022},
}