Detail of a work
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M. Hashimoto, Y. Zhang, and K. Ito, "Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards," Proceedings of International Conference on Solid State Devices and Materials (SSDM), September 2022. | |
ID | 600 |
分類 | 国際会議 |
タグ | bits cards drams error gpu neutron-induced recovery stuck their |
表題 (title) |
Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards |
表題 (英文) |
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著者名 (author) |
M. Hashimoto,Y. Zhang,K. Ito |
英文著者名 (author) |
M. Hashimoto,Y. Zhang, |
キー (key) |
M. Hashimoto,Y. Zhang, |
定期刊行物名 (journal) |
Proceedings of International Conference on Solid State Devices and Materials (SSDM) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
9 |
出版年 (year) |
2022 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id600, title = {Neutron-induced stuck error bits and their recovery in {DRAMs} on {GPU} cards}, author = {M. Hashimoto and Y. Zhang and K. Ito}, journal = {Proceedings of International Conference on Solid State Devices and Materials (SSDM)}, month = {9}, year = {2022}, } |