この検索内の頻出タグ: drams^:2 -secded^:1 bit^:1 bits^:1 burst^:1 cards^:1 effective-^:1 error^:1 errors^:1 gpu^:1 high-energy^:1 induced^:1 is^:1 longer^:1 neutron^:1 neutron-induced^:1 no^:1 recovery^:1 single^:1 stacked-capacitor^:1 stuck^:1 their^:1 upsets^:1 versus^:1

2 件の該当がありました． : このページのURL : HTML

国際会議

[1] M. Kamibayashi, K. Kobayashi, and M. Hashimoto, "Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective-," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.

[2] M. Hashimoto, Y. Zhang, and K. Ito, "Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards," Proceedings of International Conference on Solid State Devices and Materials (SSDM), September 2022.