: M. Kamibayashi, K. Kobayashi, and M. Hashimoto, Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective-, October 2022.
Detail of a work
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| M. Kamibayashi, K. Kobayashi, and M. Hashimoto, "Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective-," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022. | |
| ID | 599 |
| 分類 | 国際会議 |
| タグ | -secded bit burst drams effective- errors high-energy induced is longer neutron no single stacked-capacitor upsets versus |
| 表題 (title) |
Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective- |
| 表題 (英文) |
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| 著者名 (author) |
M. Kamibayashi,K. Kobayashi,M. Hashimoto |
| 英文著者名 (author) |
,K. Kobayashi,M. Hashimoto |
| キー (key) |
,K. Kobayashi,M. Hashimoto |
| 定期刊行物名 (journal) |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
10 |
| 出版年 (year) |
2022 |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id599,
title = {Single Bit Upsets versus Burst Errors of Stacked-Capacitor {DRAMs} Induced by High-Energy Neutron -{SECDED} is No Longer Effective-},
author = {M. Kamibayashi and K. Kobayashi and M. Hashimoto},
journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
month = {10},
year = {2022},
}
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