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この検索内の頻出タグ: -secded:1 bit:1 burst:1 drams:1 effective-:1 errors:1 high-energy:1 induced:1 is:1 longer:1 neutron:1 no:1 single:1 stacked-capacitor:1 upsets:1 versus:1

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国際会議
[1] M. Kamibayashi, K. Kobayashi, and M. Hashimoto, "Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective-," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.