国際会議
[1] M. Kamibayashi, K. Kobayashi, and M. Hashimoto, "Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective-," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.