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論文誌

[1] T. Tanaka, W. Liao, M. Hashimoto, and Y. Mitsuyama, "Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior," IEEE Transactions on Nuclear Science, volume 69, number 1, pages 35--42, January 2022. [pdf]

国際会議

[1] M. Kamibayashi, K. Kobayashi, and M. Hashimoto, "Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective-," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.

[2] T. Hsu, D. Yang, W. Liao, M. Itoh, M. Hashimoto, , and J. Liou, "Processor SER Estimation with ACE Bit Analysis," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2021.