Table of works
Frequent tags in this search: errors:12 soft:6 neutron:4 sram:4 upsets:4 10t:3 cell:3 irradiation:3 multiple:3 subthreshold:3 65-nm:2 alpha-particle-induced:2 analyzing:2 control:2 due:2 error:2 fault:2 flow:2 high-energy:2 induced:2 injection:2 measurement:2 noise:2 test:2 timing:2 -secded:1 125:1 55-nm:1 analysis:1 bit:1
12 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| Academic Journal |
|
A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement |
IEEE Solid-State Circuits Letters | 8 |
245-248 |
September 2025 |
pdf | |
| Academic Journal |
, Y. Zhang, , , , M. Hashimoto |
Analyzing DUE Errors on GPUs with Neutron Irradiation Test and Fault Injection to Control Flow |
IEEE Transactions on Nuclear Science | 68(8) |
1668--1674 |
August 2021 |
pdf | |
| Academic Journal |
Y. Masuda, T. Onoye, M. Hashimoto |
Performance Evaluation of Software-Based Error Detection Mechanisms for Supply Noise Induced Timing Errors |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences | E100-A(7) |
1452--1463 |
July 2017 |
pdf | |
| Academic Journal |
H. Fuketa, R. Harada, M. Hashimoto, T. Onoye |
Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM |
IEEE Transactions on Device and Materials Reliability | 14(1) |
463 -- 470 |
March 2014 |
185.pdf | |
| Academic Journal |
H. Fuketa, M. Hashimoto, Y. Mitsuyama, T. Onoye |
Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM |
IEEE Transactions on Nuclear Science | 58(4) |
2097--2102 |
August 2011 |
159.pdf | |
| Academic Journal |
T. Kanamoto, S. Akutsu, T. Nakabayashi, T. Ichinomiya, K. Hachiya, A. Kurokawa, H. Ishikawa, S. Muromoto, H. Kobayashi, M. Hashimoto |
Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences | E89-A(12) |
3666-3670 |
December 2006 |
5.pdf | |
| International Conference |
M. Hashimoto |
Characterization and Understanding of Cosmic Ray-Induced Soft Errors in SRAMs |
Proceedings of International Meeting for Future of Electron Devices, Kansai | November 2024 |
pdf | |||
| International Conference |
, , , M. Hashimoto |
Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | September 2023 |
||||
| International Conference |
, K. Kobayashi, M. Hashimoto |
Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective- |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | October 2022 |
||||
| International Conference |
, Y. Zhang, , , , M. Hashimoto |
Analyzing DUE Errors with Neutron Irradiation Test and Fault Injection to Control Flow |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | October 2020 |
||||
| International Conference |
H. Fuketa, M. Hashimoto, Y. Mitsuyama, T. Onoye |
Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM |
Proceedings of International Reliability Physics Symposium (IRPS) | 213--217 |
May 2010 |
140.PDF | ||
| Book |
, , , , K. Kobayashi, , Y. Mitsuyama, M. Hashimoto, T. Onoye, H. Kanbara, H. Ochi, K. Wakabayashi, H. Onodera |
Radiation-Induced Soft Errors |
Book chapter, VLSI Design and Test for Systems Dependability, Springer | August 2018 |