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10 件の該当がありました． : このページのURL : HTML

論文誌

[1] K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, "Analyzing DUE Errors on GPUs with Neutron Irradiation Test and Fault Injection to Control Flow," IEEE Transactions on Nuclear Science, volume 68, number 8, pages 1668--1674, August 2021. [pdf]

[2] Y. Masuda, T. Onoye, and M. Hashimoto, "Performance Evaluation of Software-Based Error Detection Mechanisms for Supply Noise Induced Timing Errors," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E100-A, number 7, pages 1452--1463, July 2017. [pdf]

[3] H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM," IEEE Transactions on Device and Materials Reliability, volume 14, number 1, 463 -- 470, March 2014. [185.pdf]

[4] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," IEEE Transactions on Nuclear Science, volume 58, number 4, pages 2097--2102, August 2011. [159.pdf]

[5] T. Kanamoto, S. Akutsu, T. Nakabayashi, T. Ichinomiya, K. Hachiya, A. Kurokawa, H. Ishikawa, S. Muromoto, H. Kobayashi, and M. Hashimoto, "Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3666-3670, December 2006. [5.pdf]

国際会議

[1] M. Yoshida, R. Iwamoto, M. Itoh, and M. Hashimoto, "Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2023.

[2] M. Kamibayashi, K. Kobayashi, and M. Hashimoto, "Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective-," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.

[3] K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, "Analyzing DUE Errors with Neutron Irradiation Test and Fault Injection to Control Flow," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2020.

[4] H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," Proceedings of International Reliability Physics Symposium (IRPS), pages 213--217, May 2010. [140.PDF]

著書

[1] E. Ibe, S. Yoshimoto, M. Yoshimoto, H. Kawaguchi, K. Kobayashi, J. Furuta, Y. Mitsuyama, M. Hashimoto, T. Onoye, H. Kanbara, H. Ochi, K. Wakabayashi, H. Onodera, and M. Sugihara, "Radiation-Induced Soft Errors," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018.