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17 件の該当がありました. : このページのURL : HTML


論文誌
[1] S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, "A Terrestrial SER Estimation Methodology Based on Simulation Coupled with One-Time Neutron Irradiation Testing," IEEE Transactions on Nuclear Science, volume 70, number 8, 1652 -- 1657, August 2023. [pdf]
[2] H. Konoura, D. Alnajjar, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-Based Design and Its Irradiation Testing," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 12, pages 2518--2529, December 2014. [210.pdf]
[3] H. Kobayashi, N. Ono, T. Sato, J. Iwai, H. Nakashima, T. Okumura, and M. Hashimoto, "Proposal of Metrics for SSTA Accuracy Evaluation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E90-A, number 4, pages 808--814, April 2007. [81.pdf]
[4] T. Kanamoto, S. Akutsu, T. Nakabayashi, T. Ichinomiya, K. Hachiya, A. Kurokawa, H. Ishikawa, S. Muromoto, H. Kobayashi, and M. Hashimoto, "Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3666-3670, December 2006. [5.pdf]
[5] 金本俊幾, 佐藤高史, 黒川敦, 川上善之, 岡宏規, 北浦智靖, 小林宏行, 橋本昌宜, "遅延計算におけるインダクタンスを考慮すべき配線の統計的選別手法," 情報処理学会論文誌, volume 44, number 5, pages 1301-1310, 2003年5月. [21.pdf]
国際会議
[1] S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, "A Terrestrial SER Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2022.
[2] M. Hashimoto, D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Compatible with High-Level Synthesis," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 14--15, January 2015. [213.pdf]
[3] D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing," Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pages 313--316, November 2013. [196.pdf]
[4] T. Sato, T. Kanamoto, A. Kurokawa, Y. Kawakami, H. Oka, T. Kitaura, H. Kobayashi, and M. Hashimoto, "Accurate Prediction of the Impact of On-Chip Inductance on Interconnect Delay Using Electrical and Physical Parameters," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 149-155, January 2003. [40.pdf]
[5] T. Iwahashi, T. Shibayama, M. Hashimoto, K. Kobayashi, and H. Onodera, "Vector Quantization Processor for Mobile Video Communication," In Proceedings of IEEE International ASIC/SOC Conference, pages 75-79, September 2000. [61.pdf]
国内会議(査読付き)
[1] 小林宏行、小野信任、佐藤高史、岩井二郎、橋本昌宜, "統計的STA の精度検証手法," 情報処理学会DAシンポジウム, pages 7-12, 2006年7月.
[2] 小林宏行, 小野信任, 佐藤高史, 岩井二郎, 橋本昌宜, "統計的STAの有効性の検証手法," 第19回 回路とシステム(軽井沢)ワークショップ, pages 553-558, 2006年4月. [74.pdf]
[3] 金本俊幾, 阿久津滋聖, 中林太美世, 一宮敬弘, 蜂屋孝太郎, 石川博, 室本栄, 小林宏行, 橋本昌宜, 黒川敦, "遅延計算およびシグナルインテグリティを考慮した配線寄生容量抽出精度評価," 情報処理学会DAシンポジウム, pages 265-270, 2004年7月.
[4] 金本俊幾, 佐藤高史, 黒川敦, 川上善之, 岡宏規, 北浦智靖, 池内敦彦, 小林宏行, 橋本昌宜, "0.1μm級LSIの遅延計算における寄生インダクタンスを考慮すべき配線の統計的選別手法," 情報処理学会DAシンポジウム, pages 149-154, 2002年7月.
[5] 佐藤高史, 金本俊幾, 黒川敦, 川上善之, 岡宏規, 北浦智靖, 池内敦彦, 小林宏行, 橋本昌宜, "インダクタンスが配線遅延に及ぼす影響の定量的評価方法," 第15回 回路とシステム(軽井沢)ワークショップ, pages 493-498, 2002年4月.
研究会・全国大会等
[1] 佐藤高史, 金本俊幾, 黒川敦, 川上善之, 岡宏規, 北浦智靖, 池内敦彦, 小林宏行, 橋本昌宜, "インダクタンスに起因する配線遅延変動の統計的予測手法," 2002年電子情報通信学会ソサイエティ大会講演論文集, number TA-2-4, pages 247-248, 2002年9月.
著書
[1] E. Ibe, S. Yoshimoto, M. Yoshimoto, H. Kawaguchi, K. Kobayashi, J. Furuta, Y. Mitsuyama, M. Hashimoto, T. Onoye, H. Kanbara, H. Ochi, K. Wakabayashi, H. Onodera, and M. Sugihara, "Radiation-Induced Soft Errors," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018.