: M. Hashimoto, Characterization and Understanding of Cosmic Ray-Induced Soft Errors in SRAMs, November 2024.
Detail of a work
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| M. Hashimoto, "Characterization and Understanding of Cosmic Ray-Induced Soft Errors in SRAMs," Proceedings of International Meeting for Future of Electron Devices, Kansai, November 2024. | |
| ID | 650 |
| 分類 | 国際会議 |
| タグ | characterization cosmic errors rayinduced soft srams understanding |
| 表題 (title) |
Characterization and Understanding of Cosmic Ray-Induced Soft Errors in SRAMs |
| 表題 (英文) |
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| 著者名 (author) |
M. Hashimoto |
| 英文著者名 (author) |
M. Hashimoto |
| キー (key) |
M. Hashimoto |
| 定期刊行物名 (journal) |
Proceedings of International Meeting for Future of Electron Devices, Kansai |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
11 |
| 出版年 (year) |
2024 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id650,
title = {Characterization and Understanding of Cosmic Ray-Induced Soft Errors in {SRAMs}},
author = {M. Hashimoto},
journal = {Proceedings of International Meeting for Future of Electron Devices, Kansai},
month = {11},
year = {2024},
}
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