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H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," Proceedings of International Reliability Physics Symposium (IRPS), pp. 213--217, May 2010. | |
ID | 260 |
分類 | 国際会議 |
タグ | 10t 65-nm alpha-particle-induced cell errors multiple soft sram subthreshold upsets |
表題 (title) |
Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM |
表題 (英文) |
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著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
英文著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
キー (key) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
定期刊行物名 (journal) |
Proceedings of International Reliability Physics Symposium (IRPS) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
213--217 |
刊行月 (month) |
5 |
出版年 (year) |
2010 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 140.PDF (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id260, title = {Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}}, author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye}, journal = {Proceedings of International Reliability Physics Symposium (IRPS)}, pages = {213--217}, month = {5}, year = {2010}, } |