: H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM, May 2010.
Detail of a work
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| H. Fuketa, M. Hashimoto, Y. Mitsuyama, and T. Onoye, "Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," Proceedings of International Reliability Physics Symposium (IRPS), pp. 213--217, May 2010. | |
| ID | 260 |
| 分類 | 国際会議 |
| タグ | 10t 65-nm alpha-particle-induced cell errors multiple soft sram subthreshold upsets |
| 表題 (title) |
Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM |
| 表題 (英文) |
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| 著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
| 英文著者名 (author) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
| キー (key) |
H. Fuketa,M. Hashimoto,Y. Mitsuyama,T. Onoye |
| 定期刊行物名 (journal) |
Proceedings of International Reliability Physics Symposium (IRPS) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
213--217 |
| 刊行月 (month) |
5 |
| 出版年 (year) |
2010 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 140.PDF (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id260,
title = {Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}},
author = {H. Fuketa and M. Hashimoto and Y. Mitsuyama and T. Onoye},
journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
pages = {213--217},
month = {5},
year = {2010},
}
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