: E. Ibe, S. Yoshimoto, M. Yoshimoto, H. Kawaguchi, K. Kobayashi, J. Furuta, Y. Mitsuyama, M. Hashimoto, T. Onoye, H. Kanbara, H. Ochi, K. Wakabayashi, H. Onodera, and M. Sugihara, Radiation-Induced Soft Errors, August 2018.
Detail of a work
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| E. Ibe, S. Yoshimoto, M. Yoshimoto, H. Kawaguchi, K. Kobayashi, J. Furuta, Y. Mitsuyama, M. Hashimoto, T. Onoye, H. Kanbara, H. Ochi, K. Wakabayashi, H. Onodera, and M. Sugihara, "Radiation-Induced Soft Errors," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018. | |
| ID | 492 |
| 分類 | 著書 |
| タグ | errors radiation-induced soft |
| 表題 (title) |
Radiation-Induced Soft Errors |
| 表題 (英文) |
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| 著者名 (author) |
E. Ibe,S. Yoshimoto,M. Yoshimoto,H. Kawaguchi,K. Kobayashi,J. Furuta,Y. Mitsuyama,M. Hashimoto,T. Onoye,H. Kanbara,H. Ochi,K. Wakabayashi,H. Onodera,M. Sugihara |
| 英文著者名 (author) |
,,,,K. Kobayashi,,Y. Mitsuyama,M. Hashimoto,T. Onoye,H. Kanbara,H. Ochi,K. Wakabayashi,H. Onodera, |
| キー (key) |
,,,,K. Kobayashi,,Y. Mitsuyama,M. Hashimoto,T. Onoye,H. Kanbara,H. Ochi,K. Wakabayashi,H. Onodera, |
| 定期刊行物名 (journal) |
Book chapter, VLSI Design and Test for Systems Dependability, Springer |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
8 |
| 出版年 (year) |
2018 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id492,
title = {Radiation-Induced Soft Errors},
author = {E. Ibe and S. Yoshimoto and M. Yoshimoto and H. Kawaguchi and K. Kobayashi and J. Furuta and Y. Mitsuyama and M. Hashimoto and T. Onoye and H. Kanbara and H. Ochi and K. Wakabayashi and H. Onodera and M. Sugihara},
journal = {Book chapter, VLSI Design and Test for Systems Dependability, Springer},
month = {8},
year = {2018},
}
|