Academic Journal
|
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A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement
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IEEE Solid-State Circuits Letters
| 8
|
245-248
|
September 2025
|
| pdf
|
Academic Journal
|
W. Liao, , S. Abe, Y. Mitsuyama, M. Hashimoto
|
Characterizing Energetic Dependence of Low-energy Neutron-induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65 nm Bulk SRAM
|
IEEE Transactions on Nuclear Science
| 68(6)
|
1228-1234
|
June 2021
|
| pdf
|
Academic Journal
|
M. Hashimoto, K. Kobayashi, , S. Abe, Y. Watanabe
|
Characterizing SRAM and FF Soft Error Rates with Measurement and Simulation (Invited)
|
Integration, the VLSI Journal
| 69
|
161--179
|
November 2019
|
| pdf
|
Academic Journal
|
W. Liao, M. Hashimoto, S. Manabe, S. Abe, Y. Watanabe
|
Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1390 -- 1397
|
July 2019
|
| pdf
|
Academic Journal
|
W. Liao, M. Hashimoto
|
Analyzing Impacts of SRAM, FF and Combinational Circuit on Chip-Level Neutron-Induced Soft Error Rate
|
IEICE Trans. on Electronics
| E102-C(4)
|
296--302
|
April 2019
|
| pdf
|
Academic Journal
|
H. Fuketa, R. Harada, M. Hashimoto, T. Onoye
|
Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM
|
IEEE Transactions on Device and Materials Reliability
| 14(1)
|
463 -- 470
|
March 2014
|
| 185.pdf
|
Academic Journal
|
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
|
Soft-Error in SRAM at Ultra-Low Voltage and Impact of Secondary Proton in Terrestrial Environment
|
IEEE Transactions on Nuclear Science
| 60(6)
|
4232--4237
|
December 2013
|
| 198.pdf
|
Academic Journal
|
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, Y. Watanabe
|
Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
|
IEEE Transactions on Nuclear Science
| 59(6)
|
2791--2795
|
December 2012
|
| 175.pdf
|
Academic Journal
|
H. Fuketa, M. Hashimoto, Y. Mitsuyama, T. Onoye
|
Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
|
IEEE Transactions on Nuclear Science
| 58(4)
|
2097--2102
|
August 2011
|
| 159.pdf
|
International Conference
|
M. Hashimoto
|
ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges
|
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)
|
|
379 - 384
|
January 2025
|
| pdf
|
International Conference
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, , Y. Miyake
|
Impact of Incident Angle on Negative Muon-Induced SEU Cross Section of 65-nm Bulk SRAM
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2019
|
|
|
International Conference
|
W. Liao, M. Hashimoto, S. Manabe, S. Abe, Y. Watanabe
|
Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2018
|
|
|
International Conference
|
W. Liao, S. Hirokawa, R. Harada, M. Hashimoto
|
Contributions of SRAM, FF and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate -- Bulk vs. FD-SOI at 0.5 and 1.0V --
|
Proceedings of International NEWCAS Conference
|
|
33-37
|
June 2017
|
| pdf
|
International Conference
|
T. Uemura, T. Kato, S. Okano, H. Matsuyama, M. Hashimoto
|
Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM
|
Proceedings of International Symposium on Reliability Physics (IRPS)
|
|
|
April 2015
|
| 215.pdf
|
International Conference
|
M. Hashimoto
|
Soft Error Immunity of Subthreshold SRAM (Invited)
|
Proceedings of IEEE International Conference on ASIC
|
|
91--94
|
October 2013
|
| 192.pdf
|
International Conference
|
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
|
Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
July 2013
|
|
|
International Conference
|
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
|
Soft-Error in SRAM at Ultra Low Voltage and Impact of Secondary Proton in Terrestrial Environment
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
July 2013
|
|
|
International Conference
|
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, Y. Watanabe
|
Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
July 2012
|
|
|
International Conference
|
H. Fuketa, M. Hashimoto, Y. Mitsuyama, T. Onoye
|
Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
213--217
|
May 2010
|
| 140.PDF
|
