: Y. Gomi, A. Sato, W. Madany, K. Okada, S. Adachi, M. Itoh, and M.Hashimoto, A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement, 採録済.
Detail of a work
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| Y. Gomi, A. Sato, W. Madany, K. Okada, S. Adachi, M. Itoh, and M.Hashimoto, "A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement," IEEE Solid-State Circuits Letters, 採録済. | |
| ID | 671 |
| 分類 | 論文誌 |
| タグ | 125 55-nm chip error errors event-wise every measurement ns scanning soft sram |
| 表題 (title) |
A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement |
| 表題 (英文) |
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| 著者名 (author) |
Y. Gomi,A. Sato,W. Madany,K. Okada,S. Adachi,M. Itoh,M.Hashimoto |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
IEEE Solid-State Circuits Letters |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
0 |
| 出版年 (year) |
(to appear) |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id671,
title = {A {55-nm} {SRAM} Chip Scanning Errors Every 125 {ns} for Event-Wise Soft Error Measurement},
author = {Y. Gomi and A. Sato and W. Madany and K. Okada and S. Adachi and M. Itoh and M.Hashimoto},
journal = {IEEE Solid-State Circuits Letters},
month = {0},
year = {(to appear)},
}
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