List of works
この検索内の頻出タグ: bulk:4 neutron-induced:4 rate:4 error:3 mcu:3 seu:3 soft:3 sotb:3 srams:3 alpha-:2 estimation:2 learning:2 machine:2 0.3v:1 0.4:1 0.4-v:1 0.5:1 1.0v:1 analysis:1 characterization:1 characterizing:1 chip-level:1 circuit:1 combinational:1 contributions:1 fd-soi:1 ff:1 invited:1 measurement:1 multiple:1
- 論文誌
- [1] S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, "Characterizing Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4-V SRAMs," IEEE Transactions on Nuclear Science, volume 62, number 2, pages 420--427, April 2015. [219.pdf]
- 国際会議
- [1] M. Hashimoto, W. Liao, and S. Hirokawa, "Soft Error Rate Estimation with TCAD and Machine Learning (Invited)," Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), September 2017. [pdf]
- [2] W. Liao, S. Hirokawa, R. Harada, and M. Hashimoto, "Contributions of SRAM, FF and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate -- Bulk vs. FD-SOI at 0.5 and 1.0V --," Proceedings of International NEWCAS Conference, pages 33-37, June 2017. [pdf]
- [3] S. Hirokawa, R. Harada, K. Sakuta, Y. Watanabe, and M. Hashimoto, "Multiple Sensitive Volume Based Soft Error Rate Estimation with Machine Learning," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2016. [pdf]
- [4] S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.
- [5] R. Harada, S. Hirokawa, and M. Hashimoto, "Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.