- 論文誌
- [1] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Soft-Error in SRAM at Ultra-Low Voltage and Impact of Secondary Proton in Terrestrial Environment," IEEE Transactions on Nuclear Science, volume 60, number 6, pages 4232--4237, December 2013. [198.pdf]
- 国際会議
- [1] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.
- [2] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Soft-Error in SRAM at Ultra Low Voltage and Impact of Secondary Proton in Terrestrial Environment," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.