Academic Journal
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, , , , , , M. Hashimoto
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Reliability Exploration of System-On-Chip with Multi-Bit-Width Accelerator for Multi-Precision Deep Neural Networks
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IEEE Transactions on Circuits and Systems I: Regular Papers
| 70(10)
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3978 -- 3991
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October 2023
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| pdf
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Academic Journal
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B. Li, M. Hashimoto, U. Schlichtmann
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From Process Variations to Reliability: a Survey of Timing of Digital Circuits in the Nanometer Era (Invited)
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IPSJ Transactions on System LSI Design Methodology
| 11
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2--15
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February 2018
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International Conference
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Genshin: a Generalized Framework with Software-Hardware Co-Design and Pruned Fault Injection for Reliability Analysis
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Proceedings of International Test Conference (ITC)
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(accepted, to appear)
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International Conference
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, , , , , , , M. Hashimoto
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Tenpura: a General Transient Fault Evaluation and Scope Narrowing Platform for Ultra-Fast Reliability Analysis
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Proceedings of International Conference on Computer-Aided Design (ICCAD)
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(accepted, to appear)
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International Conference
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T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
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Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology
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IEEE Nuclear and Space Radiation Effects Conference (NSREC)
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July 2013
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International Conference
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H. Konoura, Y. Mitsuyama, M. Hashimoto, T. Onoye
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Implications of Reliability Enhancement Achieved by Fault Avoidance on Dynamically Reconfigurable Architecture
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Proceedings of International Conference on Field Programmable Logic and Applications (FPL)
|
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189--194
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September 2011
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| 162.pdf
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International Conference
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D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, T. Onoye
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MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability
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IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE)
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March 2011
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