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論文誌

[1] Q. Cheng, M. Huang, C. Man, A. Shen, L. Dai, H. Yu, and M. Hashimoto, "Reliability Exploration of System-On-Chip with Multi-Bit-Width Accelerator for Multi-Precision Deep Neural Networks," IEEE Transactions on Circuits and Systems I: Regular Papers, volume 70, number 10, 3978 -- 3991, October 2023. [pdf]

[2] B. Li, M. Hashimoto, and U. Schlichtmann, "From Process Variations to Reliability: a Survey of Timing of Digital Circuits in the Nanometer Era (Invited)," IPSJ Transactions on System LSI Design Methodology, volume 11, pages 2--15, February 2018.

国際会議

[1] Quan Cheng, Haoyuan Li, Wang LIAO, Feng Liang, Longyang Lin and Masanori Hashimoto, "Gohan: a Golden-Copy-Aided Platform Enabling Online Hybrid-Interactive Reliability Analysis," Proceedings of Design, Automation and Test in Europe Conference (DATE), 採録済.

[2] Weirong Dong, Kai Zhou, Zhen Kong, Zhenke Yang, Quan Cheng, Haoyuan Li, Junkai Huang, Masanori Hashimoto and Longyang Lin, "Drift-Aware Reliability Calibration for Rram In-Memory Computing Via Vector-Based Lightweight Approach," Proceedings of Design Automation Conference (DAC), 採録済.

[3] Q. Cheng, H. Zhang, C.-H. Liang, M. Zhang, J.-J. Liou, J. Xiong, L. Lin, and M. Hashimoto, "Tenpura: a General Transient Fault Evaluation and Scope Narrowing Platform for Ultra-Fast Reliability Analysis," Proceedings of International Conference on Computer-Aided Design (ICCAD), October 2025. [pdf]

[4] Quan Cheng, Hao-Yang Chi, Chien-Hsing Liang, Yu-Hong Chao, Huizi Zhang, Yuan Liang, Mingtao Zhang, Wang Liao, Jinjun Xiong, Jing-Jia Liou, Masanori Hashimoto, and Longyang Lin, "Genshin: a Generalized Framework with Software-Hardware Co-Design and Pruned Fault Injection for Reliability Analysis," Proceedings of International Test Conference (ITC), September 2025. [pdf]

[5] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.

[6] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Implications of Reliability Enhancement Achieved by Fault Avoidance on Dynamically Reconfigurable Architecture," Proceedings of International Conference on Field Programmable Logic and Applications (FPL), pages 189--194, September 2011. [162.pdf]

[7] D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability," IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), March 2011.