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論文誌

[1] Q. Cheng, M. Huang, C. Man, A. Shen, L. Dai, H. Yu, and M. Hashimoto, "Reliability Exploration of System-On-Chip with Multi-Bit-Width Accelerator for Multi-Precision Deep Neural Networks," IEEE Transactions on Circuits and Systems I: Regular Papers, volume 70, number 10, 3978 -- 3991, October 2023. [pdf]

[2] B. Li, M. Hashimoto, and U. Schlichtmann, "From Process Variations to Reliability: a Survey of Timing of Digital Circuits in the Nanometer Era (Invited)," IPSJ Transactions on System LSI Design Methodology, volume 11, pages 2--15, February 2018.

国際会議

[1] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2013.

[2] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Implications of Reliability Enhancement Achieved by Fault Avoidance on Dynamically Reconfigurable Architecture," Proceedings of International Conference on Field Programmable Logic and Applications (FPL), pages 189--194, September 2011. [162.pdf]

[3] D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability," IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), March 2011.