Detail of a work
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D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability," IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), March 2011. | |
ID | 297 |
分類 | 国際会議 |
タグ | alpha architecture coarse-grained flexible measurement mttf particle radiation reconfigurable reliability |
表題 (title) |
MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability |
表題 (英文) |
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著者名 (author) |
D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
英文著者名 (author) |
D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
キー (key) |
D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
定期刊行物名 (journal) |
IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
3 |
出版年 (year) |
2011 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id297, title = {{MTTF} Measurement Under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability}, author = {D. Alnajjar and H. Kounoura and Y. Mitsuyama and M. Hashimoto and T. Onoye}, journal = {IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE)}, month = {3}, year = {2011}, } |