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D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability," IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), March 2011.
ID 297
分類 国際会議
タグ alpha architecture coarse-grained flexible measurement mttf particle radiation reconfigurable reliability
表題 (title) MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability
表題 (英文)
著者名 (author) D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author) D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
キー (key) D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
定期刊行物名 (journal) IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 3
出版年 (year) 2011
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id297,
         title = {{MTTF} Measurement Under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability},
        author = {D. Alnajjar and H. Kounoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE)},
         month = {3},
          year = {2011},
}