Detail of a work
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| D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability," IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE), March 2011. | |
| ID | 297 |
| 分類 | 国際会議 |
| タグ | alpha architecture coarse-grained flexible measurement mttf particle radiation reconfigurable reliability |
| 表題 (title) |
MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability |
| 表題 (英文) |
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| 著者名 (author) |
D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| キー (key) |
D. Alnajjar,H. Kounoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| 定期刊行物名 (journal) |
IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
3 |
| 出版年 (year) |
2011 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません. |
| BiBTeXエントリ |
@article{id297,
title = {{MTTF} Measurement Under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability},
author = {D. Alnajjar and H. Kounoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
journal = {IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE)},
month = {3},
year = {2011},
}
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