この検索内の頻出タグ: avoidance^:3 delay^:3 fault^:3 nbti^:3 reconfigurable^:3 architecture^:2 coarse-grained^:2 mitigation^:2 predictive^:2 probability^:2 random^:2 scan-in^:2 standby^:2 stress^:2 vectors^:2 achieved^:1 assessment^:1 circuit/instance/transistor-level^:1 comparative^:1 computation^:1 consideration^:1 degradation^:1 degrading^:1 devices^:1 due^:1 during^:1 dynamically^:1 enhancement^:1 estimating^:1 estimation^:1

14 件の該当がありました． : このページのURL : HTML

論文誌

[1] H. Konoura, D. Alnajjar, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-Based Design and Its Irradiation Testing," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 12, pages 2518--2529, December 2014. [210.pdf]

[2] H. Konoura, T. Imagawa, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Evaluation of Lifetime Enhancement with Fault Avoidance on Dynamically Reconfigurable Devices," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1468--1482, July 2014. [201.pdf]

[3] H. Konoura, T. Kameda, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1483--1491, July 2014. [202.pdf]

[4] D. Alnajjar, H. Konoura, Y. Ko, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Implementing Flexible Reliability in a Coarse Grained Reconfigurable Architecture," IEEE Transactions on VLSI Systems, volume 21, number 12, 2165 -- 2178, December 2013. [177.pdf]

[5] T.Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices," IEICE Trans. on Information and Systems, volume E96-D, number 8, pages 1624--1631, August 2013. [191.pdf]

[6] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Stress Probability Computation for Estimating NBTI-Induced Delay Degradation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E94-A, number 12, pages 2545--2553, December 2011. [166.pdf]

国際会議

[1] M. Hashimoto, D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Compatible with High-Level Synthesis," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 14--15, January 2015. [213.pdf]

[2] H. Konoura, D. Alnajjar, Y. Mitsuyama, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, and T. Onoye, "Mixed-Grained Reconfigurable Architecture Supporting Flexible Reliability and C-Based Design," Proceedings of International Conference on ReConFigurable Computing and FPGAs (ReConFig), December 2013. [199.pdf]

[3] D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing," Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pages 313--316, November 2013. [196.pdf]

[4] T. Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "A Predictive Delay Fault Avoidance Scheme for Coarse-Grained Reconfigurable Architecture," Proceedings of International Conference on Field Programmable Logic and Applications (FPL), August 2012. [170.pdf]

[5] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Implications of Reliability Enhancement Achieved by Fault Avoidance on Dynamically Reconfigurable Architecture," Proceedings of International Conference on Field Programmable Logic and Applications (FPL), pages 189--194, September 2011. [162.pdf]

[6] T. Kameda, H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "NBTI Mitigation by Giving Random Scan-In Vectors During Standby Mode," Proceedings of International Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS), pages 152--161, September 2011.

[7] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 646--651, March 2010. [137.pdf]

[8] D. Alnajjar, Y. Ko, T. Imagawa, H. Konoura, M. Hiromoto, Y. Mitsuyama, M. Hashimoto, H. Ochi, and T. Onoye, "Coarse-Grained Dynamically Reconfigurable Architecture with Flexible Reliability," Proceedings of International Conference on Field Programmable Logic and Applications (FPL), pages 186--192, August 2009. [133.pdf]