: D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing, November 2013.
Detail of a work
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| D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing," Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pp. 313--316, November 2013. | |
| ID | 363 |
| 分類 | 国際会議 |
| タグ | |
| 表題 (title) |
Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing |
| 表題 (英文) |
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| 著者名 (author) |
D. Alnajjar,H. Konoura,Y. Mitsuyama,H. Shimada,K. Kobayashi,H. Kanbara,H. Ochi,T. Imagawa,S. Noda,K. Wakabayashi,M. Hashimoto,T. Onoye,H. Onodera |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
313--316 |
| 刊行月 (month) |
11 |
| 出版年 (year) |
2013 |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 196.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id363,
title = {Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-to-Array Mapping and Its Radiation Testing},
author = {D. Alnajjar and H. Konoura and Y. Mitsuyama and H. Shimada and K. Kobayashi and H. Kanbara and H. Ochi and T. Imagawa and S. Noda and K. Wakabayashi and M. Hashimoto and T. Onoye and H. Onodera},
journal = {Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC)},
pages = {313--316},
month = {11},
year = {2013},
}
|